Field enhancement and rectification of surface plasmons detected by scanning tunneling microscopy

2011 ◽  
Vol 83 (20) ◽  
Author(s):  
Miklós Lenner ◽  
Péter Rácz ◽  
Péter Dombi ◽  
Győző Farkas ◽  
Norbert Kroó
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Plasmons ◽  
Field Enhancement ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Giant optical field enhancement in multi-dielectric stacks by photon scanning tunneling microscopy

2013 ◽  
Vol 103 (13) ◽  
pp. 131102 ◽  
Author(s):  
C. Ndiaye ◽  
M. Zerrad ◽  
A. L. Lereu ◽  
R. Roche ◽  
Ph. Dumas ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Field Enhancement ◽  
Optical Field ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

scholarly journals Edge scattering of surface plasmons excited by scanning tunneling microscopy

2013 ◽  
Vol 21 (12) ◽  
pp. 13938 ◽  
Author(s):  
Yang Zhang ◽  
Elizabeth Boer-Duchemin ◽  
Tao Wang ◽  
Benoit Rogez ◽  
Geneviève Comtet ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Plasmons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Edge Scattering

Scanning Probe Microscopy of Surface Plasmons

1997 ◽  
Vol 11 (21) ◽  
pp. 2465-2510 ◽  
Author(s):  
Igor I. Smolyaninov
Keyword(s):  
Surface Plasmons ◽  
Local Field ◽  
Electromagnetic Waves ◽  
Light Emission ◽  
Near Field ◽  
Field Enhancement ◽  
Weak Localization ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Recent development of novel scanning probe techniques such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Near-Field Optical Microscopy (NFOM) has opened new ways to study local field distribution of surface electromagnetic waves. A lot of experimental efforts have been concentrated on the study of surface plasmons (SP). Different techniques allow to excite and probe SPs with wavelengths from 1 nm down to the optical range along its entire dispersion curve. Large number of phenomena have been studied directly, such as SP scattering by individual defects, strong and weak localization of SP, SP induced local field enhancement, light emission from the tunneling junction, etc. Scanning probe techniques allow not only topography and field mapping but also surface modification and lithography on the nanometer scale. Combination of these features in the same experimental setup proved to be extremely useful in SP studies. For example, some prototype two dimensional optical elements able to control SP propagation have been demonstrated.

A study on α-RuCl3 crystal structure by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 30-31
Author(s):  
H.-J. Cantow ◽  
H. Hillebrecht ◽  
S. Magonov ◽  
H. W. Rotter ◽  
G. Thiele
Keyword(s):  
Crystal Structure ◽  
Density Distribution ◽  
Scanning Tunneling Microscopy ◽  
Electron Density ◽  
Structure Determination ◽  
Electron Density Distribution ◽  
Scanning Tunneling ◽  
Monoclinic Space Group ◽  
Tunneling Microscopy ◽  
X Ray

From X-ray analysis, the conclusions are drawn from averaged molecular informations. Thus, limitations are caused when analyzing systems whose symmetry is reduced due to interatomic interactions. In contrast, scanning tunneling microscopy (STM) directly images atomic scale surface electron density distribution, with a resolution up to fractions of Angstrom units. The crucial point is the correlation between the electron density distribution and the localization of individual atoms, which is reasonable in many cases. Thus, the use of STM images for crystal structure determination may be permitted. We tried to apply RuCl3 - a layered material with semiconductive properties - for such STM studies. From the X-ray analysis it has been assumed that α-form of this compound crystallizes in the monoclinic space group C2/m (AICI3 type). The chlorine atoms form an almost undistorted cubic closed package while Ru occupies 2/3 of the octahedral holes in every second layer building up a plane hexagon net (graphite net). Idealizing the arrangement of the chlorines a hexagonal symmetry would be expected. X-ray structure determination of isotypic compounds e.g. IrBr3 leads only to averaged positions of the metal atoms as there exist extended stacking faults of the metal layers.

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

Practical applications of scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 18-19
Author(s):  
D. R. Denley
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Quantitative Information ◽  
Digital Data ◽  
Scanning Tunneling ◽  
Ambient Atmosphere ◽  
Tunneling Microscopy ◽  
Clear Trend ◽  
Practical Applications ◽  
Promising Tool

Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.

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