Layer-dependent Debye temperature and thermal expansion of Ru(0001) by means of high-energy resolution core-level photoelectron spectroscopy

2010 ◽  
Vol 82 (19) ◽  
Author(s):  
Eugenio Ferrari ◽  
Lorenzo Galli ◽  
Elisa Miniussi ◽  
Maurizio Morri ◽  
Mirko Panighel ◽  
...  
Keyword(s):  
Thermal Expansion ◽  
Debye Temperature ◽  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
Core Level ◽  
High Energy Resolution

The (1×1)→hexagonal structural transition on Pt(100) studied by high-energy resolution core level photoemission

2007 ◽  
Vol 127 (16) ◽  
pp. 164702 ◽  
Author(s):  
Alessandro Baraldi ◽  
Erik Vesselli ◽  
Laura Bianchettin ◽  
Giovanni Comelli ◽  
Silvano Lizzit ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Structural Transition ◽  
High Energy ◽  
Core Level ◽  
High Energy Resolution

Improvement of spectrometer energy resolution for high-resolution photoelectron spectroscopy

1998 ◽  
Vol 5 (3) ◽  
pp. 1020-1022 ◽  
Author(s):  
H. Iwai ◽  
H. Namba ◽  
Y. Kido ◽  
M. Taguchi ◽  
R. Oiwa
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Kinetic Energy ◽  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
Resolving Power ◽  
High Energy Resolution ◽  
Operation Conditions ◽  
Optimized Conditions

For high-energy-resolution photoelectron spectroscopy using synchrotron radiation, the energy resolution of a commercial compact photoelectron spectrometer (hemispherical concentric spectrometer) was improved by reducing the size of the entrance and detector slits and optimizing the operation conditions of the lens voltage. Under the optimized conditions, ray-tracing simulations show that severe spectral intensity decreases can be avoided. An energy resolution of 6.2 meV and a resolving power of 8100 at a kinetic energy of 50 eV were experimentally obtained.

Submicrometre-area high-energy-resolution photoelectron spectroscopy system

1998 ◽  
Vol 5 (3) ◽  
pp. 1111-1113 ◽  
Author(s):  
Takanori Kiyokura ◽  
Fumihiko Maeda ◽  
Yoshio Watanabe ◽  
Eiji Shigemasa ◽  
Akira Yagishita ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
Spectral Measurements ◽  
X Ray ◽  
Fermi Edge ◽  
Sample Position ◽  
Instrumental Resolution ◽  
Spectroscopy System

A submicrometre-area photoelectron spectroscopy system that uses a multi-layer-coated Schwarzschild objective as the soft X-ray microbeam optics has been developed. The system is located at an undulator beamline (BL-16U) at the Photon Factory in the High Energy Accelerator Research Organization. By knife-edge measurement, the microbeam size was estimated to be 160 nm at the sample position using a 25–75% criterion. Photoelectron spectral measurements revealed that the Fermi edge width was 0.12 eV, which means that the instrumental resolution was 0.05 eV, after removing the natural broadening of the Fermi edge at room temperature. This system offers both high energy resolution and high spatial resolution.

Soft X‐ray photoelectron spectroscopy with SR at high energy resolution

1991 ◽  
Vol 4 (3) ◽  
pp. 18-19 ◽  
Author(s):  
Eugen Weschke ◽  
Clemens Laubschat ◽  
Thomas Simmons ◽  
Michael Domke ◽  
Gunter Kaindl
Keyword(s):  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray

scholarly journals Characterization of the soft X-ray spectrometer PEAXIS at BESSY II

2020 ◽  
Vol 27 (1) ◽  
pp. 238-249 ◽  
Author(s):  
Christian Schulz ◽  
Klaus Lieutenant ◽  
Jie Xiao ◽  
Tommy Hofmann ◽  
Deniz Wong ◽  
...  
Keyword(s):  
Photon Energy ◽  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
Polarized Light ◽  
High Energy ◽  
Incident Photon Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Incident Photon ◽  
Linearly Polarized

The performance of the recently commissioned spectrometer PEAXIS for resonant inelastic soft X-ray scattering (RIXS) and X-ray photoelectron spectroscopy and its hosting beamline U41-PEAXIS at the BESSY II synchrotron are characterized. The beamline provides linearly polarized light from 180 eV to 1600 eV allowing for RIXS measurements in the range 200–1200 eV. The monochromator optics can be operated in different configurations to provide either high flux with up to 1012 photons s−1 within the focal spot at the sample or high energy resolution with a full width at half maximum of <40 meV at an incident photon energy of ∼400 eV. The measured total energy resolution of the RIXS spectrometer is in very good agreement with theoretically predicted values obtained by ray-tracing simulations. PEAXIS features a 5 m-long RIXS spectrometer arm that can be continuously rotated about the sample position by 106° within the horizontal photon scattering plane, thus enabling the study of momentum-transfer-dependent excitations. Selected scientific examples are presented to demonstrate the instrument capabilities, including measurements of excitations in single-crystalline NiO and in liquid acetone employing a fluid cell sample manipulator. Planned upgrades of the beamline and the RIXS spectrometer to further increase the energy resolution to ∼100 meV at 1000 eV incident photon energy are discussed.

Sign in / Sign up

Export Citation Format

Share Document