Binding sites and diffusion barriers of a Ga adatom on theGaAs(001)−c(4×4)surface from first-principles computations

2010 ◽  
Vol 82 (16) ◽  
Author(s):  
J. L. Roehl ◽  
A. Kolagatla ◽  
V. K. K. Ganguri ◽  
S. V. Khare ◽  
R. J. Phaneuf
2014 ◽  
Vol 1015 ◽  
pp. 598-601
Author(s):  
Han Yan ◽  
Pei Wang

The first principles simulations are performed to investigate the adsorption and diffusion of aluminum, gallium and indium atoms on semi-polar gallium nitrides surface, the calculations are performed by using the Car–Parrinello molecular dynamics (CPMD) method. The aluminum ad-atoms adsorption in path 1 and path 3 are much stable than in path 2. The maximum adsorption energy of path1, path2 and path3 are different, which reveal that a different barrier energy pathway between indium ad-atom diffuse along path 1, path2 and path3. Our calculation results reveal that diffusion barriers of aluminum, gallium and indium atoms on semi-polar gallium nitride surface are anisotropy.


1993 ◽  
Vol 317 ◽  
Author(s):  
V. Milman ◽  
S.J. Pennycook ◽  
D.E. Jesson ◽  
M.C. Payne ◽  
I. Stich

ABSTRACTWe identify the binding sites for adsorption of a single Ge atom on the Si (100) surface using ab initio total energy calculations. The calculated diffusion barriers are in excellent agreement with experimental estimates. Using a large supercell we resolve the controversy regarding the binding geometry and migration path for the adatom, and investigate the influence of the adatom on the buckling of Si dimers. The adatom induces a buckling defect that is frequently observed using scanning tunneling Microscopy (STM); therefore the study of single adatoms may be experimentally accessible.


2016 ◽  
Vol 18 (35) ◽  
pp. 24370-24376 ◽  
Author(s):  
Ke Liang ◽  
Xue Chen ◽  
Zhenyu Guo ◽  
Tingjun Hou ◽  
Xiaohong Zhang ◽  
...  

The effective diffusion barriers between the outer and inner surfaces of the O2c–TiO2 NT can be as low as 0.53 eV.


2017 ◽  
Vol 19 (22) ◽  
pp. 14462-14470 ◽  
Author(s):  
F. Bianchini ◽  
H. Fjellvåg ◽  
P. Vajeeston

We present a DFT-based study of Na orthosilicates Na2MSIO4 (M = Mn, Fe, CO, Ni), promising novel cathode materials. The configuration space is explored, and the Na intercalation potential and diffusion barriers are calculated.


1991 ◽  
Vol 67 (22) ◽  
pp. 3188-3191 ◽  
Author(s):  
Christopher Roland ◽  
George H. Gilmer

RSC Advances ◽  
2015 ◽  
Vol 5 (35) ◽  
pp. 27229-27234 ◽  
Author(s):  
Jingcang Su ◽  
Yong Pei ◽  
Zhenhua Yang ◽  
Xianyou Wang

Divalent Mg ion doping in NaCoO2can significantly decrease the diffusion barriers and enhance the Na ion diffusion rate.


RSC Advances ◽  
2017 ◽  
Vol 7 (14) ◽  
pp. 8421-8428 ◽  
Author(s):  
C. Y. Wang ◽  
H. Han ◽  
D. Wickramaratne ◽  
W. Zhang ◽  
H. Wang ◽  
...  

The atomic structures, stabilities, segregation behaviors and diffusion barriers of Te are studied for the bulk, surfaces and four kinds of GBs of nickel. Te behavior is found to be very sensitive to the GB type. The effect of strain on diffusion is strong for different GBs.


2015 ◽  
Vol 242 ◽  
pp. 264-270 ◽  
Author(s):  
A.G. Marinopoulos ◽  
P. Santos ◽  
J. Coutinho

Early transition metals (TMs) of the 3d and 4d rows are undesired contaminants in solar- and electronic-grade Si. From the theoretical standpoint, understanding the properties of these TMs in silicon still remains a challenging problem owing to the strong correlations among the TM d-electrons. The present study proposes a first-principles Hubbard-corrected DFT+U approach, with on-site parameters accounting separately for electron Coulomb (U) and exchange (J) effects. We use this approach together with conventional DFT to determine electrical levels and migration barriers of early 3d (Ti, V and Cr) and 4d (Zr, Nb and Mo) TMs in Si. Comparisons with experimental data allowed us to uniquely assign the deep levels in the gap appraising also the effect of on-site correlation. Our results also resolve existing controversies in the literature concerning the type and origin of the donor levels of Cr and Mo. For all the metals, with the exception of Cr, high barriers of interstitial diffusion are obtained, thus confirming that most of these TMs are slow diffusers in silicon.


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