scholarly journals Weak temperature dependence of stress relaxation in as-deposited polycrystalline gold films

2010 ◽  
Vol 82 (12) ◽  
Author(s):  
J. Leib ◽  
C. V. Thompson
2004 ◽  
Vol 22 (4) ◽  
pp. 1767-1772 ◽  
Author(s):  
C. Munuera ◽  
J. A. Aznárez ◽  
E. Rodrı́guez-Cañas ◽  
A. I. Oliva ◽  
M. Aguilar ◽  
...  

1997 ◽  
Vol 505 ◽  
Author(s):  
Kwame Owusu-Boahen ◽  
Alexander H. King

ABSTRACTWe have used transmission electron microscopy (TEM) to study the microstructure of thin gold films which were grown on 〈100〉 rock salt. The samples were annealed on the rock salt substrate or on a gold TEM specimen grid. Films annealed on rock salt had a larger mean grain size than those annealed on TEM grids. All of the annealed films have a 〈111〉 preferred orientation. Several cracks are observed in the film annealed on rock salt. Plastic yielding of the film was identified by the presence of dislocations, and is caused by tensile stress derived from grain growth. In spite of the uniform texture of the films, the observed dislocations were concentrated only in some individual grains, while their surrounding grains remained dislocation-free. Yielded grains showed no difference of orientation that would lead to higher Schmid factors, so other predictors of yielding must be considered.


2000 ◽  
Vol 26 (3) ◽  
pp. 193-195 ◽  
Author(s):  
S. V. Nalivko ◽  
A. A. Afonenko ◽  
I. S. Manak

Materials ◽  
2005 ◽  
Author(s):  
B. S. Samuel ◽  
A. V. Desai ◽  
M. A. Haque

We present experimental results to describe the stress relaxation behavior of thin (125 nm) freestanding gold films at room temperature. The experiments were performed inside a field emission scanning microscope using a MEMS-based test bed which is only 3mm × 10mm in size. The effect of stress relaxation on the young’s modulus of gold thin films is observed. The thin film specimen used in the experiment is co-fabricated with the micromechanical loading device and hence eliminates problems of alignment and gripping. Freestanding thin films provide us with information about the mechanical behavior of thin films in the absence of substrate effects.


2019 ◽  
Vol 99 (24) ◽  
Author(s):  
T. Seidelmann ◽  
F. Ungar ◽  
M. Cygorek ◽  
A. Vagov ◽  
A. M. Barth ◽  
...  

2008 ◽  
Vol 1086 ◽  
Author(s):  
Ke Du ◽  
Xiaolu Pang ◽  
Chi Chen ◽  
Alex A. Volinsky

AbstractNanoindentation tests using the Berkovich indenter tip were performed on 50 and 200 nm thick polycrystalline gold films deposited on hard substrates. Gold film hardness increased with the indentation depth due to the influence of the substrate. A procedure based on the Joslin-Oliver method was introduced to correct for the substrate effect. The method utilizes the fact that the measured elastic modulus does not change significantly with the indentation depth, which allows reducing the contact area variation used in the hardness calculation.


1997 ◽  
Vol 472 ◽  
Author(s):  
Young S. Chung ◽  
Keenan Evans ◽  
William Glaunsinger

ABSTRACTThe crystal textures of polycrystalline films of gold-palladium couples on an oxidized silicon (100) substrates were investigated via x-ray diffraction (XRD) pole figures. Studies were performed on both as-deposited and thermally annealed films. Scanning electron microscopy (SEM) was used to examine the microstructures of the seed layer thin films as deposited. The {111} texture formation of gold-palladium thin film couples displayed a strong dependence on the nature of the underlying seed layer. Gold films deposited on a palladium seed layer revealed much less degree of {111} texture, than gold films deposited directly on a silicon dioxide surface. In contrast, palladium films deposited on polycrystalline gold films showed a higher degree of {111} texture, compared to palladium films deposited directly on silicon dioxide. The {111} texture of annealed gold-palladium alloy thin films was greater for palladium on gold than for gold on palladium. These results are interpreted in terms of the gold-palladium diffusion mechanism and the interaction of the condensing metals with the oxygens of the SiO2 substrate surface.


Sign in / Sign up

Export Citation Format

Share Document