scholarly journals Continuous-wave versus time-resolved measurements of Purcell factors for quantum dots in semiconductor microcavities

2009 ◽  
Vol 80 (11) ◽  
Author(s):  
M. Munsch ◽  
A. Mosset ◽  
A. Auffèves ◽  
S. Seidelin ◽  
J. P. Poizat ◽  
...  
2003 ◽  
Vol 34 (5-8) ◽  
pp. 747-749 ◽  
Author(s):  
A.F.G. Monte ◽  
F.V. de Sales ◽  
J.J. Finley ◽  
A.M. Fox ◽  
S.W. da Silva ◽  
...  

2005 ◽  
Vol 202 (14) ◽  
pp. 2598-2603 ◽  
Author(s):  
T. Taliercio ◽  
P. Valvin ◽  
R. Intartaglia ◽  
V. Sallet ◽  
J. C. Harmand ◽  
...  

2006 ◽  
Vol 3 (11) ◽  
pp. 3717-3721 ◽  
Author(s):  
C. Zinoni ◽  
B. Alloing ◽  
C. Monat ◽  
L. H. Li ◽  
L. Lunghi ◽  
...  

2003 ◽  
Vol 770 ◽  
Author(s):  
Nathanael Smith ◽  
Max J. Lederer ◽  
Marek Samoc ◽  
Barry Luther-Davies ◽  
Robert G. Elliman

AbstractOptical pump-probe measurements were performed on planar slab waveguides containing silicon nanocrystals in an attempt to measure optical gain from photo-excited silicon nanocrystals. Two experiments were performed, one with a continuous-wave probe beam and a pulsed pump beam, giving a time resolution of approximately 25 ns, and the other with a pulsed pump and probe beam, giving a time resolution of approximately 10 ps. In both cases the intensity of the probe beam was found to be attenuated by the pump beam, with the attenuation increasing monotonically with increasing pump power. Time-resolved measurements using the first experimental arrangement showed that the probe signal recovered its initial intensity on a time scale of 45-70 μs, a value comparable to the exciton lifetime in Si nanocrystals. These data are shown to be consistent with an induced absorption process such as confined carrier absorption. No evidence for optical gain was observed.


2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Tamara Sloboda ◽  
Sebastian Svanström ◽  
Fredrik O. L. Johansson ◽  
Aneta Andruszkiewicz ◽  
Xiaoliang Zhang ◽  
...  

AbstractTime-resolved photoelectron spectroscopy can give insights into carrier dynamics and offers the possibility of element and site-specific information through the measurements of core levels. In this paper, we demonstrate that this method can access electrons dynamics in PbS quantum dots over a wide time window spanning from pico- to microseconds in a single experiment carried out at the synchrotron facility BESSY II. The method is sensitive to small changes in core level positions. Fast measurements at low pump fluences are enabled by the use of a pump laser at a lower repetition frequency than the repetition frequency of the X-ray pulses used to probe the core level electrons: Through the use of a time-resolved spectrometer, time-dependent analysis of data from all synchrotron pulses is possible. Furthermore, by picosecond control of the pump laser arrival at the sample relative to the X-ray pulses, a time-resolution limited only by the length of the X-ray pulses is achieved. Using this method, we studied the charge dynamics in thin film samples of PbS quantum dots on n-type MgZnO substrates through time-resolved measurements of the Pb 5d core level. We found a time-resolved core level shift, which we could assign to electron injection and charge accumulation at the MgZnO/PbS quantum dots interface. This assignment was confirmed through the measurement of PbS films with different thicknesses. Our results therefore give insight into the magnitude of the photovoltage generated specifically at the MgZnO/PbS interface and into the timescale of charge transport and electron injection, as well as into the timescale of charge recombination at this interface. It is a unique feature of our method that the timescale of both these processes can be accessed in a single experiment and investigated for a specific interface.


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