X-ray reflectometry characterization of porous silicon films prepared by a glancing-angle deposition method

2009 ◽  
Vol 79 (12) ◽  
Author(s):  
S. Asgharizadeh ◽  
M. Sutton ◽  
K. Robbie ◽  
T. Brown
Keyword(s):  
Porous Silicon ◽  
Glancing Angle Deposition ◽  
Silicon Films ◽  
Deposition Method ◽  
X Ray ◽  
Glancing Angle ◽  
Angle Deposition

scholarly journals Photocatalytic Activity of Nanostructured Titanium Dioxide Thin Films

2012 ◽  
Vol 2012 ◽  
pp. 1-8 ◽  
Author(s):  
Zdenek Michalcik ◽  
Marta Horakova ◽  
Petr Spatenka ◽  
Sarka Klementova ◽  
Martin Zlamal ◽  
...  
Keyword(s):  
Photocatalytic Activity ◽  
Glancing Angle Deposition ◽  
Film Structure ◽  
Deposition Method ◽  
Acid Orange 7 ◽  
Rutile Structure ◽  
Glancing Angle ◽  
Titanium Dioxide Thin Films ◽  
The Impact ◽  
Angle Deposition

The aim of this paper is to investigate the properties and photocatalytic activity of nanostructured TiO2layers. The glancing angle deposition method with DC sputtering at low temperature was applied for deposition of the layers with various columnar structures. The thin-film structure and surface morphology were analyzed by XRD, SEM, and AFM analyses. The photocatalytic activity of the films was determined by the rate constant of the decomposition of the Acid Orange 7. In dependence on the glancing angle deposition parameters, three types of columnar structures were obtained. The films feature anatase/rutile and/or amorphous structures depending on the film architecture and deposition method. All the films give the evidence of the photocatalytic activity, even those without proved anatase or rutile structure presence. The impact of columnar boundary in perspective of the photocatalytic activity of nanostructured TiO2layers was discussed as the possible factor supporting the photocatalytic activity.

Growth of Nanostructure TiO2 Films by Glancing Angle Deposition

2016 ◽  
Vol 675-676 ◽  
pp. 289-292 ◽  
Author(s):  
Theerayuth Plirdpring ◽  
Mati Horprathum ◽  
Pitak Eiamchai ◽  
Benjarong Samransuksamer ◽  
Chanunthorn Chananonnawathorn ◽  
...  
Keyword(s):  
Room Temperature ◽  
Rotation Speed ◽  
Electron Beam Evaporation ◽  
Glancing Angle Deposition ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Vapor Flux ◽  
Glancing Angle ◽  
Angle Deposition

Nanostructure TiO2 films were prepared by electron beam evaporation with glancing angle deposition technique at room temperature. The morphology, crystal structure and optical properties at various substrate rotation speeds (0-10 rpm) were investigated by field-emission scanning electron microscopy (FE-SEM), X-ray diffraction (XRD) and UV-vis spectrophotometer. The cross-section FE-SEM images illustrate that the nanostructures consist of different morphology: slanted columnar, spiral and vertical align nanorods at 0, 0.01 and 10 rpm-rotation speed, respectively. In particular, the rotation speed-controlled incoming vapor flux was found to play crucial role in the growth of nanostructure TiO2 films.

The effect of substrate rotation rate on physical properties of cadmium telluride films prepared by a glancing angle deposition method

2015 ◽  
Vol 577 ◽  
pp. 128-133 ◽  
Author(s):  
Fatemeh Hosseini Siyanaki ◽  
Hamid Rezagholipour Dizaji ◽  
Mohammad Hossein Ehsani ◽  
Shiva Khorramabadi
Keyword(s):  
Physical Properties ◽  
Cadmium Telluride ◽  
Rotation Rate ◽  
Glancing Angle Deposition ◽  
Deposition Method ◽  
Substrate Rotation ◽  
Glancing Angle ◽  
Angle Deposition

Preparation and characterization of nanostructured ZrO2 thin films by glancing angle deposition

2007 ◽  
Vol 515 (7-8) ◽  
pp. 3352-3355 ◽  
Author(s):  
Sumei Wang ◽  
Guodong Xia ◽  
Xiaoyong Fu ◽  
Hongbo He ◽  
Jianda Shao ◽  
...  
Keyword(s):  
Thin Films ◽  
Glancing Angle Deposition ◽  
Glancing Angle ◽  
Angle Deposition

Microstructural characterization of porous thin films

2002 ◽  
Vol 749 ◽  
Author(s):  
B. Djurfors ◽  
M.J. Brett ◽  
D.G. Ivey
Keyword(s):  
Crystal Structure ◽  
Microstructural Characterization ◽  
Glancing Angle Deposition ◽  
Process Variables ◽  
Porous Films ◽  
Porous Thin Films ◽  
Glancing Angle ◽  
Final Microstructure ◽  
Angle Deposition

ABSTRACTA preliminary TEM investigation of porous films fabricated by glancing angle deposition has shown the importance of surface diffusion and crystal structure in determining the final microstructure of the film. Although the process variables are extremely important in defining the morphology of the film, their effects are limited in terms of final microstructure.

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