Atomic-scale friction modulated by a buried interface: Combined atomic and friction force microscopy experiments

2008 ◽  
Vol 78 (4) ◽  
Author(s):  
S. Maier ◽  
E. Gnecco ◽  
A. Baratoff ◽  
R. Bennewitz ◽  
E. Meyer
Keyword(s):  
Friction Force ◽  
Atomic Scale ◽  
Friction Force Microscopy ◽  
Force Microscopy

Principles of atomic friction: from sticking atoms to superlubric sliding

2007 ◽  
Vol 366 (1869) ◽  
pp. 1383-1404 ◽  
Author(s):  
Hendrik Hölscher ◽  
André Schirmeisen ◽  
Udo D Schwarz
Keyword(s):  
Present Article ◽  
Friction Force ◽  
Research Field ◽  
Atomic Scale ◽  
Friction Force Microscopy ◽  
Force Microscopy ◽  
Frictional Forces ◽  
Moving Bodies ◽  
Friction Force Microscope ◽  
Made In

Tribology—the science of friction, wear and lubrication—is of great importance for all technical applications where moving bodies are in contact. Nonetheless, little progress has been made in finding an exact atomistic description of friction since Amontons proposed his empirical macroscopic laws over three centuries ago. The advent of new experimental tools such as the friction force microscope, however, enabled the investigation of frictional forces occurring at well-defined contacts down to the atomic scale. This research field has been established as nanotribology. In the present article, we review our current understanding of the principles of atomic-scale friction based on recent experiments using friction force microscopy.

Modulation of contact resonance frequency accompanying atomic-scale stick–slip in friction force microscopy

2009 ◽  
Vol 20 (49) ◽  
pp. 495701 ◽  
Author(s):  
Pascal Steiner ◽  
Raphael Roth ◽  
Enrico Gnecco ◽  
Thilo Glatzel ◽  
Alexis Baratoff ◽  
...  
Keyword(s):  
Resonance Frequency ◽  
Friction Force ◽  
Atomic Scale ◽  
Friction Force Microscopy ◽  
Stick Slip ◽  
Force Microscopy ◽  
Contact Resonance

Micro/nanotribology using atomic force microscopy/friction force microscopy: State of the art

1998 ◽  
Vol 212 (1) ◽  
pp. 1-18 ◽  
Author(s):  
B Bhushan
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Friction Force ◽  
Boundary Lubrication ◽  
Normal Load ◽  
Atomic Scale ◽  
Friction Force Microscopy ◽  
Material Transfer ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy/friction force microscopy (AFM/FFM) techniques are increasingly used for tribological studies of engineering surfaces at scales ranging from atomic and molecular to microscales. These techniques have been used to study surface roughness, adhesion, friction, scratching/wear, indentation, detection of material transfer and boundary lubrication and for nanofabrication/nanomachining purposes. Micro/nanotribological studies of materials of scientific and engineering interest have been conducted. Commonly measured roughness parameters are found to be scale dependent, requiring the need of scale-independent fractal parameters to characterize surface roughness. Measurement of atomic-scale friction of a freshly cleaved highly orientated pyrolytic graphite exhibited the same periodicity as that of corresponding topography. However, the peaks in friction and those in corresponding topography were displaced relative to each other. Variations in atomic-scale friction and the observed displacement have been explained by the variations in interatomic forces in the normal and lateral directions. Local variation in microscale friction is found to correspond to the local slope, suggesting that a ratchet mechanism is responsible for this variation. Directionality in the friction is observed on both micro- and macroscales which results from the surface preparation and anisotropy in surface roughness. Microscale friction is generally found to be smaller than macroscale friction as there is less ploughing contribution in microscale measurements. Microscale friction is load dependent and friction values increase with an increase in the normal load, approaching the macrofriction at contact stresses higher than the hardness of the softer material. The wear rate for single-crystal silicon is negligible below 20 μN and is much higher and remains approximately constant at higher loads. Elastic deformation at low loads is responsible for negligible wear. The mechanism of material removal on a microscale is studied. At the loads used in the study, material is removed by the ploughing mode in a brittle manner without much plastic deformation. Most of the wear debris is loose. Evolution of the wear has also been studied using AFM. Wear is found to be initiated at nanoscratches. AFM has been modified to obtain load-displacement curves and for measurement of nanoindentation hardness and Young's modulus of elasticity, with the depth of indentation as low as 1 nm. Hardness of ceramics on the nanoscale is found to be higher than that on the microscale. Ceramics exhibit significant plasticity and creep on the nanoscale. Scratching and indentation on nanoscales are powerful ways to screen for adhesion and resistance to deformation of ultra-thin films. Detection of material transfer on the nanoscale is possible with AFM. Boundary lubrication studies and measurement of lubricant-film thickness with a lateral resolution on a nanoscale have been conducted using AFM. Self-assembled monolayers and chemically bonded lubricant films with a mobile fraction are superior in wear resistance. Friction and wear on micro- and nanoscales at low loads have been found to be generally smaller compared to that at macroscales. Therefore, micro/nanotribological studies may help define the regimes for ultra-low friction and near-zero wear.

Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part I—General Principles and New Measurement Techniques

1994 ◽  
Vol 116 (2) ◽  
pp. 378-388 ◽  
Author(s):  
Ju-Ai Ruan ◽  
Bharat Bhushan
Keyword(s):  
Friction Force ◽  
Microelectromechanical Systems ◽  
Atomic Scale ◽  
Magnetic Storage ◽  
Basic Operation ◽  
Friction Force Microscopy ◽  
Force Measurements ◽  
Friction Forces ◽  
Force Microscopy ◽  
Friction Measurements

Friction force measurements using modified atomic force microscopy, called here Friction Force Microscopy (FFM), are becoming increasingly important in the understanding of fundamental mechanisms of friction, wear, and lubrication, and to study interfacial phenomena in micro- and nanostructures used in magnetic storage systems and Microelectromechanical Systems (MEMS). FFMs can be used to study engineering surfaces in dry or wet conditions. A review of existing designs of FFMs and methods of friction force measurements is presented. In terms of friction force measurements, there are important issues related to the basic operation and calibration of these instruments which have not been fully studied. A new method of measuring friction fore using a commercial FFM and a calibration procedure for conversion of measured data to normal and friction forces are presented. Microscale friction data of selected materials are presented and discussed in light of macro-friction measurements.

scholarly journals On the Non-trivial Origin of Atomic-Scale Patterns in Friction Force Microscopy

2018 ◽  
Vol 67 (1) ◽  
Author(s):  
Dirk W. van Baarle ◽  
Sergey Yu. Krylov ◽  
M. E. Stefan Beck ◽  
Joost W. M. Frenken
Keyword(s):  
Friction Force ◽  
Atomic Scale ◽  
Friction Force Microscopy ◽  
Force Microscopy

Friction force microscopy in ultrahigh vacuum: an atomic-scale study on KBr(001)

1995 ◽  
Vol 1 (2-3) ◽  
Author(s):  
R. L�thi ◽  
E. Meyer ◽  
L. Howald ◽  
M. Bammerlin ◽  
H.-J. G�ntherodt ◽  
...  
Keyword(s):  
Friction Force ◽  
Ultrahigh Vacuum ◽  
Atomic Scale ◽  
Friction Force Microscopy ◽  
Force Microscopy
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