Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

2008 ◽  
Vol 77 (23) ◽  
Author(s):  
F. Krok ◽  
K. Sajewicz ◽  
J. Konior ◽  
M. Goryl ◽  
P. Piatkowski ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Lateral Resolution ◽  
Kelvin Probe ◽  
Nanometer Resolution ◽  
Force Microscopy ◽  
Potential Sensitivity

High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy

2012 ◽  
Vol 100 (22) ◽  
pp. 223104 ◽  
Author(s):  
Yasuhiro Sugawara ◽  
Lili Kou ◽  
Zongmin Ma ◽  
Takeshi Kamijo ◽  
Yoshitaka Naitoh ◽  
...  
Keyword(s):  
Amplitude Modulation ◽  
High Potential ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Potential Sensitivity

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

2018 ◽  
Vol 24 (2) ◽  
pp. 126-131 ◽  
Author(s):  
Sergey Y. Luchkin ◽  
Keith J. Stevenson
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Experimental Results ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

Sign in / Sign up

Export Citation Format

Share Document