scholarly journals Frequency-dependent counting statistics in interacting nanoscale conductors

2007 ◽  
Vol 76 (16) ◽  
Author(s):  
C. Emary ◽  
D. Marcos ◽  
R. Aguado ◽  
T. Brandes
Author(s):  
Robert M. Glaeser

It is well known that a large flux of electrons must pass through a specimen in order to obtain a high resolution image while a smaller particle flux is satisfactory for a low resolution image. The minimum particle flux that is required depends upon the contrast in the image and the signal-to-noise (S/N) ratio at which the data are considered acceptable. For a given S/N associated with statistical fluxtuations, the relationship between contrast and “counting statistics” is s131_eqn1, where C = contrast; r2 is the area of a picture element corresponding to the resolution, r; N is the number of electrons incident per unit area of the specimen; f is the fraction of electrons that contribute to formation of the image, relative to the total number of electrons incident upon the object.


2000 ◽  
Vol 41 (4) ◽  
pp. 481-492
Author(s):  
Naohiko Takahashi ◽  
Morio Ito ◽  
Shuji Ishida ◽  
Takao Fujino ◽  
Mikiko Nakagawa ◽  
...  

2017 ◽  
Vol 137 (2) ◽  
pp. 147-153
Author(s):  
Akinori Hori ◽  
Hiroki Tanaka ◽  
Yuichiro Hayakawa ◽  
Hiroshi Shida ◽  
Keiji Kawahara ◽  
...  

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