Inelastic mean-free paths and surface excitation parameters by absolute reflection electron-energy loss measurements

2007 ◽  
Vol 75 (23) ◽  
Author(s):  
T. Nagatomi ◽  
K. Goto
2004 ◽  
Vol 36 (4) ◽  
pp. 334-338 ◽  
Author(s):  
Zengming Zhang ◽  
Takeshi Iyasu ◽  
Ryuichi Shimizu ◽  
Keisuke Goto ◽  
Takanori Koshikawa ◽  
...  

Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.


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