Anisotropic photoluminescence properties of oriented poly(p-phenylene-vinylene) films: Effects of dispersion of optical constants

2007 ◽  
Vol 75 (7) ◽  
Author(s):  
Cesare Soci ◽  
Davide Comoretto ◽  
Franco Marabelli ◽  
Daniel Moses
Keyword(s):  
Optical Constants ◽  
Phenylene Vinylene ◽  
Photoluminescence Properties

Optical constants of highly stretch-oriented poly(p-phenylene-vinylene): A joint experimental and theoretical study

2000 ◽  
Vol 62 (15) ◽  
pp. 10173-10184 ◽  
Author(s):  
D. Comoretto ◽  
G. Dellepiane ◽  
F. Marabelli ◽  
J. Cornil ◽  
D. A. dos Santos ◽  
...  
Keyword(s):  
Optical Constants ◽  
Theoretical Study ◽  
Phenylene Vinylene

Synthesis and photoluminescence properties of fluorine‐containing poly(phenylene vinylene) bearing hexaflurocyclopentene‐fused phenanthrene unit

2021 ◽  
Author(s):  
Hiroki Fukumoto ◽  
Kazuki Shiitsuka ◽  
Keisuke Yamada ◽  
Shigeyuki Yamada ◽  
Tsutomu Konno ◽  
...  
Keyword(s):  
Phenylene Vinylene ◽  
Photoluminescence Properties

scholarly journals Infrared dichroism studies and anisotropic photoluminescence properties of poly(para-phenylene vinylene) functionalized reduced graphene oxide

RSC Advances ◽  
2017 ◽  
Vol 7 (12) ◽  
pp. 6931-6942 ◽  
Author(s):  
M. Baibarac ◽  
M. Ilie ◽  
I. Baltog ◽  
S. Lefrant ◽  
B. Humbert
Keyword(s):  
Graphene Oxide ◽  
Reduced Graphene Oxide ◽  
Phenylene Vinylene ◽  
Photoluminescence Properties ◽  
Pl Spectra ◽  
Reduced Graphene ◽  
Infrared Dichroism

Polarized PL spectra of the composite based on 0.5 wt% RGO and PPV in un-doped state.

Polarized optical and photoluminescence properties of highly oriented poly(p-phenylene-vinylene)

2005 ◽  
Vol 153 (1-3) ◽  
pp. 281-284 ◽  
Author(s):  
D. Comoretto ◽  
C. Soci ◽  
F. Marabelli ◽  
A. Mikhailovsky ◽  
D. Moses
Keyword(s):  
Phenylene Vinylene ◽  
Photoluminescence Properties

Development of 200kV ultrahigh-resolution analytical electron microscope

1989 ◽  
Vol 47 ◽  
pp. 108-109
Author(s):  
T. Kaneyama ◽  
M. Naruse ◽  
Y. Ishida ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Optical Constants ◽  
Materials Science ◽  
Objective Lens ◽  
The Finite Element Method ◽  
Ultrahigh Resolution ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Characteristic Features ◽  
Better Than

In the field of materials science, the importance of the ultrahigh resolution analytical electron microscope (UHRAEM) is increasing. A new UHRAEM which provides a resolution of better than 0.2 nm and allows analysis of a few nm areas has been developed. [Fig. 1 shows the external view] The followings are some characteristic features of the UHRAEM.Objective lens (OL)Two types of OL polepieces (URP for ±10' specimen tilt and ARP for ±30' tilt) have been developed. The optical constants shown in the table on the next page are figures calculated by the finite element method. However, Cs was experimentally confirmed by two methods (namely, Beam Tilt method and Krivanek method) as 0.45 ∼ 0.50 mm for URP and as 0.9 ∼ 1.0 mm for ARP, respectively. Fig. 2 shows an optical diffractogram obtained from a micrograph of amorphous carbon with URP under the Scherzer defocus condition. It demonstrates a resolution of 0.19 nm and a Cs smaller than 0.5 mm.

OPTICAL CONSTANTS OF LAYER STRUCTURES FROM ELLIPSOMETRIC DATA

1983 ◽  
Vol 44 (C10) ◽  
pp. C10-31-C10-34
Author(s):  
S. Logothetidis ◽  
J. Spyridelis
Keyword(s):  
Optical Constants ◽  
Layer Structures
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