Erratum: Double-slip mechanism in atomic-scale friction: Tomlinson model at finite temperatures [Phys. Rev. B72, 235415 (2005)]

2006 ◽  
Vol 73 (16) ◽  
Author(s):  
Jun Nakamura ◽  
Shinya Wakunami ◽  
Akiko Natori
Keyword(s):  
Atomic Scale ◽  
Slip Mechanism ◽  
Tomlinson Model

scholarly journals The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl–Tomlinson model and the simulation of vibration-induced friction reduction

2010 ◽  
Vol 1 ◽  
pp. 163-171 ◽  
Author(s):  
W Merlijn van Spengen ◽  
Viviane Turq ◽  
Joost W M Frenken
Keyword(s):  
Surface Roughness ◽  
Critical Role ◽  
Measurement Data ◽  
Friction Model ◽  
Friction Reduction ◽  
Atomic Scale ◽  
Mems Devices ◽  
Tomlinson Model ◽  
Atomic Force ◽  
On Chip

We have replaced the periodic Prandtl–Tomlinson model with an atomic-scale friction model with a random roughness term describing the surface roughness of micro-electromechanical systems (MEMS) devices with sliding surfaces. This new model is shown to exhibit the same features as previously reported experimental MEMS friction loop data. The correlation function of the surface roughness is shown to play a critical role in the modelling. It is experimentally obtained by probing the sidewall surfaces of a MEMS device flipped upright in on-chip hinges with an AFM (atomic force microscope). The addition of a modulation term to the model allows us to also simulate the effect of vibration-induced friction reduction (normal-force modulation), as a function of both vibration amplitude and frequency. The results obtained agree very well with measurement data reported previously.

Numerical Investigation of Atomic Scale Kinetic Friction in Ambient Condition With a Novel Extended Prandtl-Tomlinson Model

2014 ◽  
Author(s):  
Birahima Gueye ◽  
Chenfei Sun ◽  
Yan Zhang ◽  
Yujuan Wang ◽  
Yunfei Chen
Keyword(s):  
Relative Humidity ◽  
Adhesion Force ◽  
Normal Load ◽  
Analytical Data ◽  
Two Dimensions ◽  
Atomic Scale ◽  
Kinetic Friction ◽  
Capillary Bridge ◽  
Mode Operation ◽  
Tomlinson Model

A more adequate extended Prandtl-Tomlinson model in two dimensions (2D) analysis is proposed in the aim to thoroughly investigate the interplay between kinetic friction, relative humidity (RH), normal load, and temperature in both contact and tapping mode atomic force microscopic (AFM). In contact mode operation, results firstly show that for various applied normal loads highly wetted surface in contrast to partially wetted surface exhibits lower friction at finite temperature range. This phenomenon is attributed to the film layer acting as a lubricant. Secondly, two different regimes when varying the relative humidity were further observed with increasing temperature. The first one shows the thermolubricity’s effect at low RH (RH 20%) while the second regime remarkably confirms an increase of friction with temperature at higher RH (RH60%) which is inconsistent with common observation. The latter regime is characterized by the thermally activated capillary bridge formation leading to an increase of the total adhesion force. Thirdly we demonstrated that both regimes also hold in ac mode operation and regardless to the humidity level, either low or high RH, friction force decreases with increasing amplitude modulation. Good agreement was found with measurement and analytical data reported previously. In the model treatment, however, only effects of capillary force which dominate in AFM measurement were considered.

scholarly journals Energy dissipation of atomic-scale friction based on one-dimensional Prandtl-Tomlinson model

Friction ◽  
2015 ◽  
Vol 3 (2) ◽  
pp. 170-182 ◽  
Author(s):  
Zi-Jian Wang ◽  
Tian-Bao Ma ◽  
Yuan-Zhong Hu ◽  
Liang Xu ◽  
Hui Wang
Keyword(s):  
Energy Dissipation ◽  
Atomic Scale ◽  
One Dimensional ◽  
Tomlinson Model

Structure and migration of planar defects in crystals observed in atomic scale

1978 ◽  
Vol 36 (1) ◽  
pp. 284-285 ◽  
Author(s):  
H. Hashimoto ◽  
Y. Sugimoto ◽  
Y. Takai ◽  
H. Endoh
Keyword(s):  
Electron Microscope ◽  
Rotation Angle ◽  
Crystal Surface ◽  
Electron Gun ◽  
Atomic Scale ◽  
Present Observation ◽  
Twist Boundary ◽  
Optical Magnification ◽  
Zinc Crystal ◽  
And Migration

As was demonstrated by the present authors that atomic structure of simple crystal can be photographed by the conventional 100 kV electron microscope adjusted at “aberration free focus (AFF)” condition. In order to operate the microscope at AFF condition effectively, highly stabilized electron beams with small energy spread and small beam divergence are necessary. In the present observation, a 120 kV electron microscope with LaB6 electron gun was used. The most of the images were taken with the direct electron optical magnification of 1.3 million times and then magnified photographically.1. Twist boundary of ZnSFig. 1 is the image of wurtzite single crystal with twist boundary grown on the surface of zinc crystal by the reaction of sulphur vapour of 1540 Torr at 500°C. Crystal surface is parallel to (00.1) plane and electron beam is incident along the axis normal to the crystal surface. In the twist boundary there is a dislocation net work between two perfect crystals with a certain rotation angle.

Resolution in the scanning tunneling microscope

1991 ◽  
Vol 49 ◽  
pp. 488-489
Author(s):  
R. J. Wilson ◽  
D. D. Chambliss ◽  
S. Chiang ◽  
V. M. Hallmark
Keyword(s):  
Scanning Tunneling Microscope ◽  
Fundamental Principle ◽  
Atomic Scale ◽  
Lateral Resolution ◽  
Scanning Tunneling ◽  
Electronic Noise ◽  
Vertical Resolution ◽  
Tunneling Microscopy ◽  
Spatial Profile ◽  
Theoretical Analyses

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.

What catalysis needs from the electron microscopist

1988 ◽  
Vol 46 ◽  
pp. 694-695
Author(s):  
Alexis T. Bell
Keyword(s):  
Active Sites ◽  
Heterogeneous Catalysts ◽  
Catalyst Deactivation ◽  
Surface Composition ◽  
Internal Surface ◽  
Active Phase ◽  
Atomic Scale ◽  
Metal Catalyst ◽  
Internal Surface Area ◽  
Porous Support

Heterogeneous catalysts, used in industry for the production of fuels and chemicals, are microporous solids characterized by a high internal surface area. The catalyticly active sites may occur at the surface of the bulk solid or of small crystallites deposited on a porous support. An example of the former case would be a zeolite, and of the latter, a supported metal catalyst. Since the activity and selectivity of a catalyst are known to be a function of surface composition and structure, it is highly desirable to characterize catalyst surfaces with atomic scale resolution. Where the active phase is dispersed on a support, it is also important to know the dispersion of the deposited phase, as well as its structural and compositional uniformity, the latter characteristics being particularly important in the case of multicomponent catalysts. Knowledge of the pore size and shape is also important, since these can influence the transport of reactants and products through a catalyst and the dynamics of catalyst deactivation.

Electron holography of catalysts

1995 ◽  
Vol 53 ◽  
pp. 416-417
Author(s):  
A. K. Datye ◽  
D. S. Kalakkad ◽  
L. F. Allard ◽  
E. Völkl
Keyword(s):  
Heterogeneous Catalysts ◽  
High Surface ◽  
High Surface Area ◽  
Atomic Scale ◽  
Nano Particles ◽  
Phase Image ◽  
Electron Holography ◽  
Specimen Thickness ◽  
Phase Information ◽  
Particle Structure

The active phase in heterogeneous catalysts consists of nanometer-sized metal or oxide particles dispersed within the tortuous pore structure of a high surface area matrix. Such catalysts are extensively used for controlling emissions from automobile exhausts or in industrial processes such as the refining of crude oil to produce gasoline. The morphology of these nano-particles is of great interest to catalytic chemists since it affects the activity and selectivity for a class of reactions known as structure-sensitive reactions. In this paper, we describe some of the challenges in the study of heterogeneous catalysts, and provide examples of how electron holography can help in extracting details of particle structure and morphology on an atomic scale.Conventional high-resolution TEM imaging methods permit the image intensity to be recorded, but the phase information in the complex image wave is lost. However, it is the phase information which is sensitive at the atomic scale to changes in specimen thickness and composition, and thus analysis of the phase image can yield important information on morphological details at the nanometer level.

Limits for high-resolution electron microscopy of inorganic materials?

1987 ◽  
Vol 45 ◽  
pp. 4-5
Author(s):  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Inorganic Materials ◽  
Atomic Scale ◽  
Resolution Limit ◽  
Contrast Transfer Function ◽  
Existing Problems ◽  
Resolution Electron ◽  
Electron Microscopes

The era of atomic-resolution electron microscopy has finally arrived. In virtually all inorganic materials, including oxides, metals, semiconductors and ceramics, it is possible to image individual atomic columns in low-index zone-axis projections. A whole host of important materials’ problems involving defects and departures from nonstoichiometry on the atomic scale are waiting to be tackled by the new generation of intermediate voltage (300-400keV) electron microscopes. In this review, some existing problems and limitations associated with imaging inorganic materials are briefly discussed. The more immediate problems encountered with organic and biological materials are considered elsewhere.Microscope resolution. It is less than a decade since the state-of-the-art, commercially available TEM was a 200kV instrument with a spherical aberration coefficient of 1.2mm, and an interpretable resolution limit (ie. first zero crossover of the contrast transfer function) of 2.5A.

Sign in / Sign up

Export Citation Format

Share Document