Influence of the spatial, temporal, and concentrational dependence of the diffusion coefficient on dopant dynamics: optimization of annealing time

2005 ◽  
Vol 72 (7) ◽  
Author(s):  
E. L. Pankratov
2002 ◽  
Vol 09 (02) ◽  
pp. 663-667 ◽  
Author(s):  
N. MIYATA ◽  
T. IMAZONO ◽  
S. ISHIKAWA ◽  
A. ARAI ◽  
M. YANAGIHARA ◽  
...  

We measured Si L2,3 soft-X-ray emission spectra from Mo/Si multilayers annealed at 400°C. We showed that MoSi 2 was formed at the interface, and the thickness of the MoSi 2 interlayer increased with the annealing time. By an analysis of the soft-X-ray emission spectra and the patterns of small-angle X-ray diffraction, we estimated the thickness of the MoSi 2 interlayer and a diffusion coefficient between Mo and Si at 400°C as 1.1 (± 0.2) × 10-18 cm 2/ s . We showed that soft-X-ray emission spectroscopy is a useful tool for studying the thermal change of the buried interface nondestructively.


Author(s):  
Y. J. Kim ◽  
D. M. Henderson

Natural Amelia albite (Ab99.3An0.1Or0.6) annealed at 1073° and 924°C for various periods up to 140 days has been studied by NMR. TEM studies of the same sample revealed a distinct tweed microstructure in some samples annealed at both 1073°C and 924°C. On the whole, the quasi-regular tweed has a periodicity of 100 - 200 Å in both directions, one nearly normal to b* and the other approximately parallel to b*, which gives rise to two-directional streaking in SADP’s (Fig. 1 and 2). However, there are some differences in the tweed structure developed on annealing at 1073°C and at 924°C in albite.Albite samples annealed at 1073° show a systematic trend in their development of tweed structures: the regularity, periodicity, and frequency of occurrence increase with annealing time during the first 3 days, and then decrease gradually until no tweed microstructures are seen in samples annealed for more than 15 days. The tweed structure proceeds locally to form one-directional twin-like microstructures.


1954 ◽  
Vol 46 (11) ◽  
pp. 47-49 ◽  
Author(s):  
C.Y. Lee ◽  
C.R. Wilke

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