scholarly journals Monte Carlo method for a quantum measurement process by a single-electron transistor

2004 ◽  
Vol 70 (7) ◽  
Author(s):  
Hsi-Sheng Goan
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Method ◽  
Quantum Measurement ◽  
Measurement Process ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Quantum Measurement Process

scholarly journals Statistics and Noise in a Quantum Measurement Process

2000 ◽  
Vol 85 (21) ◽  
pp. 4578-4581 ◽  
Author(s):  
Yuriy Makhlin ◽  
Gerd Schön ◽  
Alexander Shnirman
Keyword(s):  
Quantum Measurement ◽  
Measurement Process ◽  
Quantum Measurement Process

scholarly journals Engineering the quantum measurement process for the persistent current qubit

2002 ◽  
Vol 368 (1-4) ◽  
pp. 294-299 ◽  
Author(s):  
T.P. Orlando ◽  
Lin Tian ◽  
D.S. Crankshaw ◽  
S. Lloyd ◽  
C.H. van der Wal ◽  
...  
Keyword(s):  
Quantum Measurement ◽  
Persistent Current ◽  
Measurement Process ◽  
Quantum Measurement Process

Investigation on characteristics of Monte Carlo model of single electron transistor using Orthodox theory

2021 ◽  
Vol 48 ◽  
pp. 101601
Author(s):  
Ngangbam Phalguni Singh ◽  
Shruti Suman ◽  
Thandaiah Prabu Ramachandran ◽  
Tripti Sharma ◽  
Selvakumar Raja ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Model ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Orthodox Theory

scholarly journals Parametric description of the quantum measurement process

2015 ◽  
Vol 111 (4) ◽  
pp. 40008 ◽  
Author(s):  
P. Liuzzo-Scorpo ◽  
A. Cuccoli ◽  
P. Verrucchi
Keyword(s):  
Quantum Measurement ◽  
Measurement Process ◽  
Parametric Description ◽  
Quantum Measurement Process

scholarly journals Modeling and simulation of single-electron transistors

2005 ◽  
Vol 1 (1) ◽  
Author(s):  
Lee Jia Yen ◽  
Ahmad Radzi Mat Isa ◽  
Karsono Ahmad Dasuki
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Method ◽  
Electron Tunneling ◽  
Single Electron ◽  
Single Electron Transistors ◽  
Inner Work ◽  
Single Electron Tunneling ◽  
Single Electronics ◽  
Electron Transistors ◽  
Discrete Charge

Single-electron transistor (SET) can offer lower power consumption and faster operating speed in the era of nanotechnology. It operates in single electronics regime where only one electron can tunnel from source to drain via island. Thus single electron tunneling is the phenomena that describe the principle of SET. Owing to the stochastic nature of the tunneling event, a tunneling electron is considered as a discrete charge. To simulate the SET, Monte Carlo method is used due to its reasonable accuracy in the single electronics simulation. A model is described and used to study the electronic properties of SET. Monte Carlo method follows the tunneling path of a representative number of electrons and it can gives a clear picture of the inner work of the single electron circuits.

scholarly journals Statistics of the Bifurcation in Quantum Measurement

Entropy ◽  
2019 ◽  
Vol 21 (9) ◽  
pp. 834 ◽  
Author(s):  
Karl-Erik Eriksson ◽  
Kristian Lindgren
Keyword(s):  
Field Theory ◽  
Quantum Measurement ◽  
Measurement Process ◽  
Quantum Field ◽  
Born Rule ◽  
Level System ◽  
Measurement Device ◽  
Final State ◽  
Initial States ◽  
Quantum Measurement Process

We model quantum measurement of a two-level system μ . Previous obstacles for understanding the measurement process are removed by basing the analysis of the interaction between μ and the measurement device on quantum field theory. This formulation shows how inverse processes take part in the interaction and introduce a non-linearity, necessary for the bifurcation of quantum measurement. A statistical analysis of the ensemble of initial states of the measurement device shows how microscopic details can influence the transition to a final state. We find that initial states that are efficient in leading to a transition to a final state result in either of the expected eigenstates for μ , with ensemble averages that are identical to the probabilities of the Born rule. Thus, the proposed scheme serves as a candidate mechanism for the quantum measurement process.

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