Charge-carrier dynamics and trap generation in nativeSi/SiO2interfaces probed by optical second-harmonic generation
2016 ◽
Vol 136
(11)
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pp. 678-684
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2014 ◽
Vol 16
(5)
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pp. 2136-2148
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1995 ◽
Vol 34
(Part 1, No. 1)
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pp. 175-176
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1994 ◽
Vol 6
(10)
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pp. 2093-2099
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