In situstudy of the annealing behavior of porosity in icosahedral Al-Pd-Mn quasicrystals using third generation x-ray synchrotron radiation imaging

2004 ◽  
Vol 69 (14) ◽  
Author(s):  
S. Agliozzo ◽  
J. Gastaldi ◽  
H. Klein ◽  
J. Härtwig ◽  
J. Baruchel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Generation X ◽  
Third Generation ◽  
Annealing Behavior ◽  
X Ray ◽  
Radiation Imaging

scholarly journals Microstructure Evolution of Ag/TiO2 Thin Film

2021 ◽  
Vol 7 (1) ◽  
pp. 14
Author(s):  
Dewi Suriyani Che Halin ◽  
Kamrosni Abdul Razak ◽  
Mohd Arif Anuar Mohd Salleh ◽  
Mohd Izrul Izwan Ramli ◽  
Mohd Mustafa Al Bakri Abdullah ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Growth Rate ◽  
Synchrotron Radiation ◽  
Tio2 Thin Film ◽  
Sol Gel ◽  
Tio2 Thin Films ◽  
Contact Mode ◽  
X Ray ◽  
Radiation Imaging

Ag/TiO2 thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO2 thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO2 thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO2 thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO2 also increased in terms of area and the number of junctions. The growth rate of Ag/TiO2 at 600 s was 47.26 µm2/s, and after 1200 s it decreased to 11.50 µm2/s and 11.55 µm2/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm2/s, 4.12 µm2/s and 4.86 µm2/s at 2400 s, 3000 s and 3600 s, respectively.

Conserving the Coherence and Uniformity of Third-Generation Synchrotron Radiation Beams: the Case of ID19, a `Long' Beamline at the ESRF

1998 ◽  
Vol 5 (5) ◽  
pp. 1243-1249 ◽  
Author(s):  
José I. Espeso ◽  
Peter Cloetens ◽  
José Baruchel ◽  
Jürgen Härtwig ◽  
Trevor Mairs ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Phase Contrast ◽  
Angular Size ◽  
Third Generation ◽  
Optical Elements ◽  
X Ray ◽  
Front End ◽  
Ray Path ◽  
Radiation Beams

The lateral coherence length is of the order of 100 µm at the `long' (145 m) ID19 beamline of the ESRF, which is mainly devoted to imaging. Most of the optical elements located along the X-ray path can thus act as `phase objects', and lead to spurious contrast and/or to coherence degradation, which shows up as an enhanced effective angular size of the source. Both the spurious contrast and the coherence degradation are detrimental for the images (diffraction topographs, tomographs, phase-contrast images) produced at this beamline. The problems identified and the way they were solved during the commissioning of ID19 are reported. More particularly, the role of the protection foils located in the front end, the beryllium windows, the filters and the monochromator defects (scratches, dust, small vibrations) is discussed.

scholarly journals Third-generation synchrotron radiation X-ray optics

Structure ◽  
1996 ◽  
Vol 4 (2) ◽  
pp. 121-125 ◽  
Author(s):  
Andreas K Freund
Keyword(s):  
Synchrotron Radiation ◽  
Third Generation ◽  
Ray Optics ◽  
X Ray
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