Fermi contour imaging of the two-dimensional semimetalErSi2by Fourier transform STM

2004 ◽  
Vol 69 (8) ◽  
Author(s):  
F. Vonau ◽  
D. Aubel ◽  
G. Gewinner ◽  
C. Pirri ◽  
J. C. Peruchetti ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Two Dimensional ◽  
Fermi Contour

Direct imaging of the two-dimensional Fermi contour: Fourier-transform STM

1998 ◽  
Vol 57 (12) ◽  
pp. R6858-R6861 ◽  
Author(s):  
L. Petersen ◽  
P. T. Sprunger ◽  
Ph. Hofmann ◽  
E. Lægsgaard ◽  
B. G. Briner ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Two Dimensional ◽  
Direct Imaging ◽  
Fermi Contour

Comparison of Calculated and Recorded Electron Energy-Loss Spectra of Aluminium and Carbon

1990 ◽  
Vol 48 (2) ◽  
pp. 64-65
Author(s):  
L. Reimer ◽  
R. Oelgeklaus
Keyword(s):  
Fourier Transform ◽  
Energy Loss ◽  
Electron Energy ◽  
Rotational Symmetry ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Two Dimensional ◽  
Image Position ◽  
Electron Energy Loss

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.

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