scholarly journals Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips

2003 ◽  
Vol 68 (19) ◽  
Author(s):  
A. S. Foster ◽  
A. Y. Gal ◽  
J. M. Airaksinen ◽  
O. H. Pakarinen ◽  
Y. J. Lee ◽  
...  
Keyword(s):  
Atomic Resolution ◽  
Chemical Identification ◽  
Afm Imaging ◽  
Noncontact Afm

Noncontact AFM imaging on a Si(111)2×1-Sb surface with occupied lone-pair orbitals

2001 ◽  
Vol 72 (S1) ◽  
pp. S11-S14
Author(s):  
Y. Sugawara ◽  
S. Orisaka ◽  
E. Hidaka ◽  
S. Morita
Keyword(s):  
Lone Pair ◽  
Afm Imaging ◽  
Noncontact Afm

scholarly journals Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2×1)diamond surfaces using noncontact AFM

2010 ◽  
Vol 81 (20) ◽  
Author(s):  
M. Nimmrich ◽  
M. Kittelmann ◽  
P. Rahe ◽  
A. J. Mayne ◽  
G. Dujardin ◽  
...  
Keyword(s):  
Atomic Resolution ◽  
Diamond Surfaces ◽  
Resolution Imaging ◽  
Noncontact Afm

STM and atomic-resolution noncontact AFM of an oxygen-deficientTiO2(110)surface

2000 ◽  
Vol 61 (20) ◽  
pp. 13955-13959 ◽  
Author(s):  
M. Ashino ◽  
T. Uchihashi ◽  
K. Yokoyama ◽  
Y. Sugawara ◽  
S. Morita ◽  
...  
Keyword(s):  
Atomic Resolution ◽  
Noncontact Afm

scholarly journals Insights into the physical chemistry of materials from advances in HAADF-STEM

2015 ◽  
Vol 17 (6) ◽  
pp. 3982-4006 ◽  
Author(s):  
Karl Sohlberg ◽  
Timothy J. Pennycook ◽  
Wu Zhou ◽  
Stephen J. Pennycook
Keyword(s):  
Physical Chemistry ◽  
Real Space ◽  
Atomic Resolution ◽  
Dopant Atom ◽  
Chemical Identification ◽  
Graphene Lattice

HAADF-STEM provides atomic-resolution real space imaging. Here an image of a single Si dopant atom in a graphene lattice is shown adjacent to a schematic of the instrument. Simultaneous EELS on electrons scattered to low angles can provide chemical identification of the species preset. Differences between the Si L-edge spectra reveal differences in atomic bonding and hybridization for different configurations of Si atoms in graphene.

Chemical identification at atomic resolution on Cu(110)-O surface using NC-AFM

2015 ◽  
Vol 45 (1) ◽  
pp. 017002-017002
Author(s):  
Jun LIU ◽  
ChenYang XUE ◽  
ZongMin MA ◽  
Jun TANG ◽  
YunBo SHI ◽  
...  
Keyword(s):  
Atomic Resolution ◽  
Chemical Identification

Improving the atomic-resolution AFM imaging of monolayer MoS2for worn tips: a molecular dynamics study

2019 ◽  
Vol 58 (5) ◽  
pp. 055003
Author(s):  
Minglin Li ◽  
Weirong Zhuo ◽  
Haosheng Pang ◽  
Lianfeng Lai
Keyword(s):  
Molecular Dynamics ◽  
Atomic Resolution ◽  
Afm Imaging

Non-contact atomic-force microscopy for soft surfaces

1993 ◽  
Vol 51 ◽  
pp. 516-517
Author(s):  
R. S. Howland ◽  
D. F. Oot ◽  
R. Nowroozi-Esfahani ◽  
G. J. Maclay ◽  
P. J. Hesketh
Keyword(s):  
Surface Preparation ◽  
Sample Surface ◽  
Real Space ◽  
Contact Forces ◽  
Scanning Tunneling ◽  
Force Microscopy ◽  
Insulating Surfaces ◽  
Atomic Force ◽  
Afm Imaging ◽  
Noncontact Afm

The atomic force microscope (AFM) was invented in the mid-1980s, in response to strong interest in the high resolution, real-space surface imaging capabilities of the scanning tunneling microscope (STM). The AFM provides one real benefit that the STM cannot: it is able to image insulating surfaces. As a result, the AFM can operate on a wider variety of samples; it also can image samples in air, where many conductors oxidize rapidly, and in solution. Essentially no surface preparation is necessary. Historically, however, even the AFM has had limitations. Until recently, the contact forces exerted by the AFM tip on the sample surface meant that AFM was limited to surfaces of substantial rigidity. Noncontact AFM removes that barrier, opening up the possibility of AFM imaging of very soft surfaces, or of surfaces that cannot be contaminated by contact with the tip.An AFM uses a piezoelectric transducer to scan the sample beneath a sharp probe.

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