scholarly journals Effect of sample size on the magnetic critical current density in nano-SiC dopedMgB2superconductors

2003 ◽  
Vol 68 (13) ◽  
Author(s):  
S. Soltanian ◽  
M. J. Qin ◽  
S. Keshavarzi ◽  
X. L. Wang ◽  
S. X. Dou
Keyword(s):  
Critical Current Density ◽  
Sample Size ◽  
Critical Current ◽  
Current Density

scholarly journals Sample-size dependence of the magnetic critical current density inMgB2superconductors

2004 ◽  
Vol 69 (1) ◽  
Author(s):  
M. J. Qin ◽  
S. Keshavarzi ◽  
S. Soltanian ◽  
X. L. Wang ◽  
H. K. Liu ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Sample Size ◽  
Critical Current ◽  
Current Density ◽  
Size Dependence

INDUCTANCE TECHNIQUE FOR MEASURING TRANSITION TEMPERATURES OF SUPERCONDUCTING POWDERS

1989 ◽  
Vol 03 (05) ◽  
pp. 763-772 ◽  
Author(s):  
T. K. VETHANAYAGAM ◽  
W. A. SCHULZE ◽  
J. A. T. TAYLOR ◽  
R. L. SNYDER
Keyword(s):  
Particle Size ◽  
Critical Current Density ◽  
Sample Size ◽  
Critical Current ◽  
Current Density ◽  
Superconducting State ◽  
Simple Technique ◽  
Electrical Contacts ◽  
Powder Samples ◽  
Effect Of Particle Size

A simple technique to measure T c of superconducting powder samples is evaluated. Inductance of the sample is used as the indicator to determine the behavior of the material as it goes to the superconducting state. The effect of particle size and sample size on the measured parameters has been investigated. The main advantages of this technique are the absence of electrical contacts and the elimination of the need for sintered bars. The technique has the potential to measure the amount of superconducting phases as well as the critical current density.

Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

1991 ◽  
Vol 49 ◽  
pp. 1080-1081
Author(s):  
P. Lu ◽  
W. Huang ◽  
C.S. Chern ◽  
Y.Q. Li ◽  
J. Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Film Growth ◽  
Chemical Vapor ◽  
Microstructural Characterization ◽  
Ion Milling ◽  
Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

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