Local structure of expanded fluid mercury using synchrotron radiation: From liquid to dense vapor

2003 ◽  
Vol 68 (9) ◽  
Author(s):  
Masanori Inui ◽  
Xinguo Hong ◽  
Kozaburo Tamura
2011 ◽  
Vol 110 (5) ◽  
pp. 053504 ◽  
Author(s):  
Atsushi Hanafusa ◽  
Yasuji Muramatsu ◽  
Yutaka Kaburagi ◽  
Akira Yoshida ◽  
Yoshihiro Hishiyama ◽  
...  

2015 ◽  
Vol 17 (42) ◽  
pp. 28239-28249 ◽  
Author(s):  
Marcel Miglierini ◽  
Márius Pavlovič ◽  
Vít Procházka ◽  
Tomáš Hatala ◽  
Gerhard Schumacher ◽  
...  

In situ transformation of local structure and hyperfine interactions are simultaneously followed in real time during temperature annealing of metallic glasses.


2007 ◽  
Vol 539-543 ◽  
pp. 1959-1963 ◽  
Author(s):  
M. Matsuura ◽  
Masaki Sakurai ◽  
Wei Zhang ◽  
A. Inoue

XAFS measurements of the Cu, Ni and Zr K-edges for the melt-quenched Zr67Cu33 and Zr67Ni33 metallic glasses were curried out using synchrotron radiation at 20K. Fitting calculations for the EXAFS results reveal that local structure around Ni and Zr in Zr67Ni33 is well represented by those for the crystalline Zr2Ni, while local structure around Zr in Zr67Cu33 is better fitted by an icosahedron rather than crystalline Zr2Cu. Such differences of the local structure attribute to the differences of the stability of super-cooled liquid state and glass formability between Zr67Cu33 and Zr67Ni33 metallic glasses.


Coatings ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 330 ◽  
Author(s):  
Kazuhiro Kanda ◽  
Shuto Suzuki ◽  
Masahito Niibe ◽  
Takayuki Hasegawa ◽  
Tsuneo Suzuki ◽  
...  

In this paper, the local structure of silicon-containing diamond-like carbon (Si-DLC) films is discussed based on the measurement of C K-edge and Si K-edge near-edge x-ray absorption fine structure (NEXAFS) spectra using the synchrotron radiation of 11 types of Si-DLC film fabricated with various synthesis methods and having different elemental compositions. In the C K-edge NEXAFS spectra of the Si-DLC films, the σ* band shrunk and shifted to the lower-energy side, and the π* peak broadened with an increase in the Si content in the Si-DLC films. However, there were no significant changes observed in the Si K-edge NEXAFS spectra with an increase in the Si content. These results indicate that Si–Si bonding is not formed with precedence in Si-DLC film.


2002 ◽  
Vol 312-314 ◽  
pp. 274-278 ◽  
Author(s):  
Masanori Inui ◽  
Xinguo Hong ◽  
Tetsuya Matsusaka ◽  
Daisuke Ishikawa ◽  
Moynul Huq Kazi ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (30) ◽  
pp. 25368-25374 ◽  
Author(s):  
Jing Liu ◽  
Katla Sai Krishna ◽  
Chanaka Kumara ◽  
Soma Chattopadhyay ◽  
Tomohiro Shibata ◽  
...  

Synchrotron radiation-based X-ray absorption fine structure (XAFS) of thiol-stabilized Au∼98Ag∼46(SR)60 nanoclusters suggests that Au atoms preferred to occupy the metal core sites while the Ag atoms were mainly on the surface.


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