Nonuniform H distribution in thin-film hydrogenated amorphous Si by small-angle neutron scattering

2003 ◽  
Vol 67 (7) ◽  
Author(s):  
D. L. Williamson ◽  
D. W. M. Marr ◽  
J. Yang ◽  
B. Yan ◽  
S. Guha
Keyword(s):  
Thin Film ◽  
Neutron Scattering ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Amorphous Si ◽  
Hydrogenated Amorphous

scholarly journals Morphology of Thin Film Composite Membranes Explored by Small-Angle Neutron Scattering and Positron-Annihilation Lifetime Spectroscopy

Membranes ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 48 ◽  
Author(s):  
Vitaliy Pipich ◽  
Marcel Dickmann ◽  
Henrich Frielinghaus ◽  
Roni Kasher ◽  
Christoph Hugenschmidt ◽  
...  
Keyword(s):  
Thin Film ◽  
Neutron Scattering ◽  
Positron Annihilation ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Positron Annihilation Lifetime Spectroscopy ◽  
Film Composite ◽  
Positron Annihilation Lifetime ◽  
Thin Film Composite

The morphology of thin film composite (TFC) membranes used in reverse osmosis (RO) and nanofiltration (NF) water treatment was explored with small-angle neutron scattering (SANS) and positron-annihilation lifetime spectroscopy (PALS). The combination of both methods allowed the characterization of the bulk porous structure from a few Å to µm in radius. PALS shows pores of ~4.5 Å average radius in a surface layer of about 4 μm thickness, which become ~40% smaller at the free surface of the membranes. This observation may correlate with the glass state of the involved polymer. Pores of similar size appear in SANS as closely packed pores of ~6 Å radius distributed with an average distance of ~30 Å. The main effort of SANS was the characterization of the morphology of the porous polysulfone support layer as well as the fibers of the nonwoven fabric layer. Contrast variation using the media H2O/D2O and supercritical CO2 and CD4 identified the polymers of the support layers as well as internal heterogeneities.

A small angle neutron scattering (SANS) study of hydrogen in hydrogenated amorphous silicon

1996 ◽  
Vol 196 ◽  
pp. 260-266 ◽  
Author(s):  
Carlo A. Guy ◽  
Adrian C. Wright ◽  
Roger N. Sinclair ◽  
Roger J. Stewart ◽  
Frank Jansen
Keyword(s):  
Neutron Scattering ◽  
Amorphous Silicon ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Hydrogenated Amorphous Silicon ◽  
Hydrogenated Amorphous

Medium Range Structure of Hydrogenated Amorphous Ti84Si16

1999 ◽  
Vol 54 (12) ◽  
pp. 704-710
Author(s):  
A. Pojtinger ◽  
P. Lamparter ◽  
S. Steeb
Keyword(s):  
Fractal Dimension ◽  
Neutron Scattering ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Signal Change ◽  
Melt Spun ◽  
Medium Range ◽  
Integrated Intensity ◽  
Hydrogenated Amorphous ◽  
Scattering Signal

Abstract Amorphous melt-spun Ti84Si16 was investigated by small angle neutron scattering (SANS) in the blank state as well as after loading with hydrogen or deuterium. The integrated intensity and the fractal dimension of the SANS signal change strongly with increasing H, D content. A model is proposed which explains the changes of the scattering signal. By means of this model it is concluded that melt-spun amorphous Ti84Si16 consists of two types of regions. The first type contains pure Ti and the composition of the second type is Ti80Si20-The inner surfaces between these types of regions have fractal features.

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