Quantitative determination of the atomic scattering tensor in orbitally orderedYTiO3by using a resonant x-ray scattering technique

2002 ◽  
Vol 66 (18) ◽  
Author(s):  
H. Nakao ◽  
Y. Wakabayashi ◽  
T. Kiyama ◽  
Y. Murakami ◽  
M. v. Zimmermann ◽  
...  
Keyword(s):  
Quantitative Determination ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Technique ◽  
Atomic Scattering ◽  
Ray Scattering

Determination of displacements from nanoprecipitates in a Cu–Ni–Fe single crystal using anomalous small-angle and large-angle X-ray scattering

2001 ◽  
Vol 34 (4) ◽  
pp. 484-492 ◽  
Author(s):  
O. Lyon ◽  
I. Guillon ◽  
C. Servant
Keyword(s):  
Single Crystals ◽  
Small Angle ◽  
Large Angle ◽  
Partial Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Measurements ◽  
Atomic Scattering ◽  
Ray Scattering

Single crystals of Cu–41.5 at.% Ni–16 at.% Fe have been studied by small-angle and large-angle X-ray scattering in order to determine the displacements induced by the disc-like precipitates formed during decomposition. The small-angle X-ray scattering (SAXS) patterns gave information on the size and the organization of the precipitates, while the scattering near Bragg peaks allows a determination of the distortions of the lattice created by these precipitates. The variations of the atomic scattering factors of Fe, Ni and Cu (for the large-angle measurements) were used to determine both the partial structure functions (`chemical' data) and the partial displacements. The precipitates were found to be enriched in Fe and Ni, which induced a contraction of the lattice, while the depleted matrix (mainly Cu) was dilated. This succession of compressed and dilated regions is very stable and prevents a single precipitate from growing much in this direction during coarsening. This can explain why a single precipitate tends to grow mainly in the orthogonal directions, where the extension of the displacements is smaller than the precipitated region.

A New X-Ray Scattering Method for Determining Pore-Size Distribution in Low-k Thin Films

2001 ◽  
Vol 714 ◽  
Author(s):  
Kazuhiko Omote ◽  
Shigeru Kawamura
Keyword(s):  
Thin Films ◽  
Pore Size Distribution ◽  
Pore Size ◽  
Gas Adsorption ◽  
Size Distributions ◽  
X Ray ◽  
X Ray Scattering ◽  
Pore Size Distributions ◽  
Scattering Technique ◽  
Ray Scattering

ABSTRACTWe have successively developed a new x-ray scattering technique for a non-destructive determination of pore-size distributions in porous low-κ thin films formed on thick substrates. The pore size distribution in a film is derived from x-ray diffuse scattering data, which are measured using offset θ/2θ scans to avoid strong specular reflections from the film surface and its substrate. Γ-distribution mode for the pores in the film is used in the calculation. The average diameter and the dispersion parameter of the Γ-distribution function are varied and refined by computer so that the calculated scattering pattern best matches to the experimental pattern. The technique has been used to analyze porous methyl silsesquioxane (MSQ) films. The pore size distributions determined by the x-ray scattering technique agree with that of the commonly used gas adsorption technique. The x-ray technique has been also used successfully determine small pores less than one nanometer in diameter, which is well below the lowest limit of the gas adsorption technique.

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