Quasiparticle diffusion and the energy resolution of superconducting tunneling junctions as photon detectors. I. Theory

2002 ◽  
Vol 66 (9) ◽  
Author(s):  
A. G. Kozorezov ◽  
J. K. Wigmore ◽  
Roland den Hartog ◽  
D. Martin ◽  
P. Verhoeve ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Photon Detectors ◽  
Quasiparticle Diffusion ◽  
Tunneling Junctions

Quasiparticle diffusion and the energy resolution of superconducting tunneling junctions as photon detectors. II. Experiment

2002 ◽  
Vol 66 (9) ◽  
Author(s):  
Roland den Hartog ◽  
A. G. Kozorezov ◽  
J. K. Wigmore ◽  
D. Martin ◽  
P. Verhoeve ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Photon Detectors ◽  
Quasiparticle Diffusion ◽  
Tunneling Junctions

scholarly journals Quasiparticle diffusion and energy resolution in superconducting tunneling junctions

2002 ◽  
Author(s):  
Roland den Hartog ◽  
A. G. Kozorezov ◽  
J. K. Wigmore ◽  
P. Verhoeve ◽  
D. Martin ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Quasiparticle Diffusion ◽  
Tunneling Junctions

scholarly journals Phonon-Trapping-Enhanced Energy Resolution in Superconducting Single-Photon Detectors

2021 ◽  
Vol 16 (3) ◽  
Author(s):  
Pieter J. de Visser ◽  
Steven A.H. de Rooij ◽  
Vignesh Murugesan ◽  
David J. Thoen ◽  
Jochem J.A. Baselmans
Keyword(s):  
Energy Resolution ◽  
Single Photon ◽  
Photon Detectors ◽  
Single Photon Detectors

DEVELOPMENT OF SUPERCONDUCTING TUNNEL JUNCTIONS FOR EUV DETECTORS

2002 ◽  
Vol 09 (01) ◽  
pp. 561-565 ◽  
Author(s):  
Y. TAKIZAWA ◽  
T. IKEDA ◽  
T. OKU ◽  
C. OTANI ◽  
K. KAWAI ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Tunnel Junctions ◽  
Extreme Ultraviolet ◽  
Photon Counting ◽  
External Noise ◽  
Absorption Efficiency ◽  
Superconducting Tunnel Junctions ◽  
Photon Detectors ◽  
Synchrotron Facility ◽  
High Absorption

Superconducting tunnel junctions (STJs) are applicable to as photon detectors with an energy resolution and a high photon-counting rate. The absorption of a photon in the superconductor of the STJ generates a number of quasiparticles that is proportional to the photon energy. Especially for soft X-ray and extreme ultraviolet (EUV) applications, STJs have good performance because of their high absorption efficiency below 1 keV. We are developing an energy-dispersive photon detector for EUV radiation using STJs with Al trapping layers. We evaluated the performance of the detector for EUV photons by using the Synchrotron Facility at KEK-PF in Tsukuba, Japan. We achieved an energy resolution of FWHM=18 eV (including the external noise of 17.6 eV) for 55 eV EUV photons with a 100 × 100 μ m 2 STJ. We present details of the junction design and discuss our experiments and the results.

Use of LaB6 for a High Quality, Small Energy Spread Beam in an Electron Velocity Spectrometer

1976 ◽  
Vol 34 ◽  
pp. 534-535 ◽  
Author(s):  
P. E. Batson ◽  
C. H. Chen ◽  
J. Silcox
Keyword(s):  
High Temperature ◽  
Energy Resolution ◽  
Electron Velocity ◽  
Electronic Excitations ◽  
Small Energy ◽  
Small Intensity ◽  
Good Energy ◽  
Spectrometer System ◽  
Electron Energy Loss ◽  
Very High

Electron energy loss experiments combined with microscopy have proven to be a valuable tool for the exploration of the structure of electronic excitations in materials. These types of excitations, however, are difficult to measure because of their small intensity. In a usual situation, the filament of the microscope is run at a very high temperature in order to present as much intensity as possible at the specimen. This results in a degradation of the ultimate energy resolution of the instrument due to thermal broadening of the electron beam.We report here observations and measurements on a new LaB filament in a microscope-velocity spectrometer system. We have found that, in general, we may retain a good energy resolution with intensities comparable to or greater than those available with the very high temperature tungsten filament. We have also explored the energy distribution of this filament.

An improved magnetic prism design for a transmission electron microscope energy filter

1978 ◽  
Vol 36 (1) ◽  
pp. 40-41 ◽  
Author(s):  
John W. Andrew ◽  
F.P. Ottensmeyer ◽  
E. Martell
Keyword(s):  
Energy Resolution ◽  
Symmetry Plane ◽  
Fringe Field ◽  
Focal Distance ◽  
Electron Trajectories ◽  
Focusing Effect ◽  
Transmission Electron ◽  
Path Lengths ◽  
Electron Microscopes ◽  
Focusing Properties

Energy selecting electron microscopes of the Castaing-Henry prism-mirror-prism design suffer from a loss of image and energy resolution with increasing field of view. These effects can be qualitatively understood by examining the focusing properties of the prism shown in Fig. 1. A cone of electrons emerges from the entrance lens crossover A and impinges on the planar face of the prism. The task of the prism is to focus these electrons to a point B at a focal distance f2 from the side of the prism. Electrons traveling in the plane of the diagram (i.e., the symmetry plane of the prism) are focused toward point B due to the different path lengths of different electron trajectories in the triangularly shaped magnetic field. This is referred to as horizontal focusing; the better this focusing effect the better the energy resolution of the spectrometer. Electrons in a plane perpendicular to the diagram and containing the central ray of the incident cone are focused toward B by the curved fringe field of the prism.

ELNES of Iron Compounds

1990 ◽  
Vol 48 (2) ◽  
pp. 28-29
Author(s):  
Hiroki Kurata ◽  
Kazuhiro Nagai ◽  
Seiji Isoda ◽  
Takashi Kobayashi
Keyword(s):  
Energy Loss ◽  
Metal Ions ◽  
Energy Resolution ◽  
Transition Metal Oxides ◽  
Local Symmetry ◽  
Iron Compounds ◽  
Fine Structures ◽  
Electron Energy Loss ◽  
Fe Ions ◽  
Electron Energy Loss Spectra

Electron energy loss spectra of transition metal oxides, which show various fine structures in inner shell edges, have been extensively studied. These structures and their positions are related to the oxidation state of metal ions. In this sence an influence of anions coordinated with the metal ions is very interesting. In the present work, we have investigated the energy loss near-edge structures (ELNES) of some iron compounds, i.e. oxides, chlorides, fluorides and potassium cyanides. In these compounds, Fe ions (Fe2+ or Fe3+) are octahedrally surrounded by six ligand anions and this means that the local symmetry around each iron is almost isotropic.EELS spectra were obtained using a JEM-2000FX with a Gatan Model-666 PEELS. The energy resolution was about leV which was mainly due to the energy spread of LaB6 -filament. The threshole energies of each edges were measured using a voltage scan module which was calibrated by setting the Ni L3 peak in NiO to an energy value of 853 eV.

Parallel Detection of Electron Energy Loss Spectra in Direct Mode

1990 ◽  
Vol 48 (2) ◽  
pp. 82-83
Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Energy Resolution ◽  
Large Angle ◽  
Maximum Energy ◽  
Semiconductor Detectors ◽  
Parallel Detection ◽  
Photodiode Arrays ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.

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