Stress effect on the ferroelectric-to-paraelectric phase transition in heteroepitaxial(Ba,Sr)TiO3/(001)MgOthin film studied by Raman scattering and x-ray diffraction

2002 ◽  
Vol 66 (5) ◽  
Author(s):  
Yu. I. Yuzyuk ◽  
P. Simon ◽  
I. N. Zakharchenko ◽  
V. A. Alyoshin ◽  
E. V. Sviridov
2000 ◽  
Vol 655 ◽  
Author(s):  
Matt Poulsen ◽  
S. Adenwalla ◽  
Stephen Ducharme ◽  
V.M. Fridkin ◽  
S.P. Palto ◽  
...  

AbstractX-ray diffraction was used to probe the structural changes associated with the conversion of the paraelectric phase to the ferroelectric phase that results from the application of a large external electric field. The samples under study are ultrathin (150 to 250 Å) Langmuir-Blodgett films of the copolymer vinylidene fluoride (70%) with trifluoroethylene (30%) deposited on aluminum-coated silicon. Theta-2theta X-ray diffraction was used to measure the change in inter-layer spacing perpendicular to the film surface. Upon heating at zero external electric field, the crystalline films undergo a structural phase transition, at 100± 5°C, from the all-trans ferroelectric phase to the trans-gauche paraelectric phase. [1,2] Above the phase transition temperature, the non-polar paraelectric phase can be converted back to the polar ferroelectric phase, in a smooth continuous process, using a large external electric field (∼1 GV/m). For example, at 100° C the ferroelectric phase first appears above 0.2 GV/m and increases steadily in proportion while the paraelectric phase decreases until complete conversion to the ferroelectric phase is achieved at approximately 0.6 GV/m.


2005 ◽  
Vol 74 (8) ◽  
pp. 2165-2168 ◽  
Author(s):  
Yoichi Okimoto ◽  
Reiji Kumai ◽  
Sachio Horiuchi ◽  
Hiroshi Okamoto ◽  
Yoshinori Tokura

2004 ◽  
Vol 241 (8) ◽  
pp. 2001-2006 ◽  
Author(s):  
J. J. Lima-Silva ◽  
D. Garcia ◽  
J. Mendes Filho ◽  
J. A. Eiras ◽  
A. P. Ayala

2001 ◽  
Vol 15 (24n25) ◽  
pp. 3366-3368
Author(s):  
V. L. SOBOLEV ◽  
V. M. ISHCHUK

The phase transition from the paraelectric phase to ordered phases in Pb1-x(Li1/2La1/2)x(Zr1-yTiy)O3 with compositions close to the ferroelectric - antiferroelectric - paraelectric triple point in the Ti-content - temperature phase diagram is studied. X-ray diffraction is used to identify two - phase (antiferroelectric and ferroelectric) nuclei embeded in a paraelectric matrix. The relation between these two-phase nuclei in paraelectric phase and the diffuseness of the phase transition is discussed.


2002 ◽  
Vol 91 (10) ◽  
pp. 6493 ◽  
Author(s):  
Hirotaka Fujimori ◽  
Masatomo Yashima ◽  
Masato Kakihana ◽  
Masahiro Yoshimura

2009 ◽  
Vol 02 (04) ◽  
pp. 193-197 ◽  
Author(s):  
RATTIPHORN SUMANG ◽  
THEERACHAI BONGKARN

Polycrystalline ( Pb 1-x Sr x) TiO 3 (PST) (x = 0.25, 0.50) ceramics were synthesized by the solid-state reaction method. PST sintering temperatures ranged between 1050–1250°C. The samples were characterized by X-ray diffractometer (XRD) and scanning electron microscopy (SEM). The sintered pellets showed pure perovskite in all samples. The lattice parameter c increased, while the lattice parameter a decreased with increasing sintering temperatures. The tetragonality and average grain sizes increased when sintering temperatures were increased. The dielectric constants vs temperature curves of PST ceramics with x = 0.25 and x = 0.50 associated with the ferroelectric to paraelectric phase transition, showed a maximum peak at around 311 and 139°C, respectively. The dielectric constants of both compositions were related with their densities.


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