Surface electronic structure ofp-InP using temperature-controlled surface photovoltage spectroscopy

2002 ◽  
Vol 65 (24) ◽  
Author(s):  
N. Kinrot ◽  
Yoram Shapira
Keyword(s):  
Electronic Structure ◽  
Surface Photovoltage ◽  
Surface Photovoltage Spectroscopy ◽  
Surface Electronic Structure ◽  
Temperature Controlled

Measurements of Natural and Synthetic Diamond Samples Using Kelvin Probe, Surface Photovoltage and Ambient Pressure Photoemission Techniques

MRS Advances ◽  
2017 ◽  
Vol 2 (41) ◽  
pp. 2229-2234
Author(s):  
Susanna Challinger ◽  
Iain Baikie ◽  
A. Glen Birdwell
Keyword(s):  
Electronic Structure ◽  
Synthetic Diamond ◽  
Ambient Pressure ◽  
Natural Diamond ◽  
Continuous Illumination ◽  
Surface Photovoltage ◽  
Kelvin Probe ◽  
Diamond Sample ◽  
Surface Electronic Structure ◽  
Natural And Synthetic

ABSTRACTDiamond is a promising wide band-gap semiconductor material for use in devices; therefore a thorough understanding of the surface electronic structure is important. The Kelvin Probe (KP), Surface Photovoltage / Surface Photovoltage Spectroscopy (SPV/SPS) and Ambient Pressure Photoemission Spectroscopy (APS) techniques are commonly applied to traditional and organic semiconductor materials. The application of these techniques to synthetic and natural diamond samples provides some challenges: surface charge on the samples and atypical capacitive interaction with the KP tip. In this study, measurements using a combination of KP, SPV/SPS and APS techniques are taken of samples of natural and synthetic diamond samples to investigate their surface electronic structure and compare their different properties. These techniques are all non-contact and non-destructive. The Fermi Level position of the diamond samples was found to vary, typically between 4.3 – 4.9 eV, depending on the light illumination. For example, when a natural diamond sample was illuminated with 400 nm light from a 150W Quartz Tungsten Halogen light source, there was a surface photovoltage response of ∼250 mV. The oxygen terminated synthetic diamond sample required near continuous illumination at low visible wavelengths in order to retain sufficient conductivity to allow measurement with the Kelvin Probe. By contrast, the natural diamond samples measured showed good conductivity in the layers underneath the top surface. In summary, the KP, SPV/SPS and APS measurement techniques provided some interesting information on the diamond samples and an initial investigation of their surface electronic states is performed.

Effect of Crystallization Methods on the Surface Electronic Structure and Photoelectrochemical Properties of TiO2 Nanotube Arrays

2012 ◽  
Vol 616-618 ◽  
pp. 1906-1909
Author(s):  
Fang Gong Cai ◽  
Feng Yang ◽  
Yong Zhao
Keyword(s):  
Electronic Structure ◽  
Hydrothermal Treatment ◽  
Treatment Method ◽  
Surface Photovoltage ◽  
Nanotube Arrays ◽  
Photoelectrochemical Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Electronic Structure ◽  
Response Range

The crystallization of anatase from amorphous TiO2nanotube arrays (TNTs) has been carried out by annealing in air and hydrothermal treatment in water. The morphology and crystalline phase of obtained TNTs membranes were detailedly characterized by field emission scanning electron microscopy (FESEM) and X-ray diffraction (XRD). The surface electronic structure and photoelectrochemical properties (PEC) of TNTs obtained by different crystallization methods were investigated. The results show that the TNTs electrode crystallized by hydrothermal treatment method demonstrate a broader surface photovoltage response range and higher photoelectrochemical properties than that of TNTs electrode directly annealed in air due to effective Ti3+sites.

Investigation of P3HT/n-Si heterojunction using surface photovoltage spectroscopy

Vacuum ◽  
2012 ◽  
Vol 86 (12) ◽  
pp. 2158-2161 ◽  
Author(s):  
Yongchang Sang ◽  
Aimin Liu ◽  
Weifeng Liu ◽  
Dawei Kang
Keyword(s):  
Surface Photovoltage ◽  
Surface Photovoltage Spectroscopy

Surface electronic structure of ferromagnetic Fe(001)

2009 ◽  
Vol 80 (18) ◽  
Author(s):  
L. Plucinski ◽  
Yuan Zhao ◽  
C. M. Schneider ◽  
B. Sinkovic ◽  
E. Vescovo
Keyword(s):  
Electronic Structure ◽  
Surface Electronic Structure
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