Crosshatching on a SiGe film grown on a Si(001) substrate studied by Raman mapping and atomic force microscopy

2002 ◽  
Vol 65 (23) ◽  
Author(s):  
H. Chen ◽  
Y. K. Li ◽  
C. S. Peng ◽  
H. F. Liu ◽  
Y. L. Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Raman Mapping ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Combining Raman Spectroscopy, DFT Calculations, and Atomic Force Microscopy in the Study of Clinker Materials

Materials ◽  
2021 ◽  
Vol 14 (13) ◽  
pp. 3648
Author(s):  
Vlasta Mohaček-Grošev ◽  
Marija Đuroković ◽  
Aleksandar Maksimović
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Phonon Frequency ◽  
Cement Clinker ◽  
Chemical Information ◽  
Similar Distribution ◽  
Raman Mapping ◽  
Phonon Modes ◽  
Force Microscopy ◽  
Atomic Force

Raman spectroscopy and Raman mapping analysis, combined with density functional theory calculations were applied to the problem of differentiating similar clinker materials such as alite and belite. The Portland cement clinker 217 (further: clinker) was analysed using colocalised Raman mapping and atomic force microscopy mapping, which provided both spatial and chemical information simultaneously. The main constituents found in the clinker were alite, belite, portlandite, amorphous calcium carbonate, and gypsum. Since phonon bands of alite and belite greatly overlap, and their distinction is important for the hydration process during cement setting, we provided the calculated phonon density of states for alite Ca3SiO5 (<M>Pc structure) and belite Ca2SiO4 (β P21/n structure) here for the first time. Both calculated phonon densities have similar distribution of phonon modes, with a gap between 560 and 810 cm−1. A comparison of the calculated phonon frequencies for Ca3SiO5 and Ca2SiO4 shows that the lowest calculated phonon frequency of β-Ca2SiO4 lies at 102 cm−1, while for <M>Pc alite the lowest phonon frequency is predicted at 27 cm−1. Low frequency Raman spectroscopy could therefore be used for a clearer distinction of these two species in a clinker material.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document