Grazing incidence diffuse x-ray scattering investigation of the properties of irradiation-induced point defects in silicon

2001 ◽  
Vol 64 (23) ◽  
Author(s):  
P. Partyka ◽  
Y. Zhong ◽  
K. Nordlund ◽  
R. S. Averback ◽  
I. M. Robinson ◽  
...  
Keyword(s):  
Point Defects ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Strain Analysis in Thin La1−xCaxMnO3 Films by Grazing Incidence X-ray Scattering

1999 ◽  
Vol 602 ◽  
Author(s):  
M. Petit ◽  
L. J. Martinez-Miranda ◽  
M. Rajeswari ◽  
A. Biswas ◽  
D. J. Kang ◽  
...  
Keyword(s):  
Film Thickness ◽  
Lattice Mismatch ◽  
Compressive Strain ◽  
Strain Analysis ◽  
Grazing Incidence ◽  
Relaxation Processes ◽  
Near Surface ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractWe have performed depth profile analyses of the lattice parameters in epitaxial thin films of La1−xCaxMno3 (LCMO), where x = 0.33 or 0.3, to understand the evolution of strain relaxation processes in these materials. The analyses were done using Grazing Incidence X-ray Scattering (GIXS) on films of different thicnesses on two different substrates, (100) oriented LaAlO3 (LAO), with a lattice mismatch of ∼2% and (110) oriented NGO, with a lattice mismatch of less than 0.1%. Films grown on LAO can exhibit up to three in-plane strained lattice constants, corresponding to a slight orthorhombic distortion of the crystal, as well as near-surface and columnar lattice relaxation. As a function of film thickness, a crossover from a strained film to a mixture of strained and relaxed regions in the film occurs in the range of 700 Å. The structural evolution at this thickness coincides with a change in the resistivity curve near the metalinsulator transition. The in-plane compressive strain has a range of 0.2 – 1.5%, depending on the film thickness for filsm in the range of 400 - 1500 A.

A general model for estimating the ordering of mesoporous film by grazing incidence small angle X-ray scattering

2014 ◽  
Vol 115 (20) ◽  
pp. 204311 ◽  
Author(s):  
Nie Zhao ◽  
Chunming Yang ◽  
Qian Zhang ◽  
Xueming Lu ◽  
Yuzhu Wang ◽  
...  
Keyword(s):  
Small Angle ◽  
General Model ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Mesoporous Film ◽  
Ray Scattering

Grazing incidence small angle x-ray scattering from free-standing nanostructures

1999 ◽  
Vol 86 (12) ◽  
pp. 6763-6769 ◽  
Author(s):  
Markus Rauscher ◽  
Rogerio Paniago ◽  
Hartmut Metzger ◽  
Zoltan Kovats ◽  
Jan Domke ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Free Standing ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Molecular structure of poly(3-alkyl-thiophenes) investigated by calorimetry and grazing incidence X-ray scattering

2012 ◽  
Vol 97 ◽  
pp. 109-118 ◽  
Author(s):  
Jose Abad ◽  
Nieves Espinosa ◽  
Pilar Ferrer ◽  
Rafael García-Valverde ◽  
Carmen Miguel ◽  
...  
Keyword(s):  
Molecular Structure ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Thermal quenching sample chamber for grazing incidence small angle x-ray scattering studies of polymer films

2007 ◽  
Vol 78 (11) ◽  
pp. 113910 ◽  
Author(s):  
M. A. Singh ◽  
M. N. Groves ◽  
M. S. Müller ◽  
I. J. Stahlbrand ◽  
D.-M. Smilgies
Keyword(s):  
Polymer Films ◽  
Small Angle ◽  
Thermal Quenching ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Sample Chamber ◽  
Ray Scattering

scholarly journals A grazing incidence small-angle x-ray scattering analysis on capped Ge nanodots in layer structures

2010 ◽  
Vol 22 (47) ◽  
pp. 474003 ◽  
Author(s):  
Hiroshi Okuda ◽  
Masayuki Kato ◽  
Keiji Kuno ◽  
Shojiro Ochiai ◽  
Noritaka Usami ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Layer Structures ◽  
Ray Scattering

Grazing Incidence X-Ray Scattering

1992 ◽  
pp. 385-419 ◽  
Author(s):  
P. H. Fuoss ◽  
K. S. Liang ◽  
P. Eisenberger
Keyword(s):  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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