Phonon dispersion curves in an argon single crystal at high pressure by inelastic x-ray scattering

2001 ◽  
Vol 63 (22) ◽  
Author(s):  
F. Occelli ◽  
M. Krisch ◽  
P. Loubeyre ◽  
F. Sette ◽  
R. Le Toullec ◽  
...  
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Phonon Dispersion ◽  
Dispersion Curves ◽  
Phonon Dispersion Curves ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Phonon dispersion curves in α-SiO2 and hcp 3He and 4He determined by inelastic X-ray scattering

1999 ◽  
Vol 263-264 ◽  
pp. 412-415 ◽  
Author(s):  
E Burkel ◽  
C Seyfert ◽  
Ch Halcoussis ◽  
H Sinn ◽  
R.O Simmons
Keyword(s):  
Phonon Dispersion ◽  
Dispersion Curves ◽  
Phonon Dispersion Curves ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Phonon Dispersion Curves in Wurtzite-Structure GaN Determined by Inelastic X-Ray Scattering

2001 ◽  
Vol 86 (5) ◽  
pp. 906-909 ◽  
Author(s):  
T. Ruf ◽  
J. Serrano ◽  
M. Cardona ◽  
P. Pavone ◽  
M. Pabst ◽  
...  
Keyword(s):  
Phonon Dispersion ◽  
Dispersion Curves ◽  
Wurtzite Structure ◽  
Phonon Dispersion Curves ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Determination of Phonon Dispersion Curves at Gigapascal Pressures by Inelastic X-ray Scattering

2002 ◽  
Vol 22 (1) ◽  
pp. 73-77 ◽  
Author(s):  
M. D'astuto ◽  
M. Krisch ◽  
M. Lorenzen ◽  
A. Mermet ◽  
G. Monaco ◽  
...  
Keyword(s):  
Phonon Dispersion ◽  
Dispersion Curves ◽  
Phonon Dispersion Curves ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Single-crystal CVD diamonds as small-angle X-ray scattering windows for high-pressure research

2012 ◽  
Vol 45 (3) ◽  
pp. 453-457 ◽  
Author(s):  
Suntao Wang ◽  
Yu-fei Meng ◽  
Nozomi Ando ◽  
Mark Tate ◽  
Szczesny Krasnicki ◽  
...  
Keyword(s):  
High Pressure ◽  
Chemical Vapor Deposition ◽  
Single Crystal ◽  
Small Angle ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
High Optical Quality ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Small-angle X-ray scattering (SAXS) was performed on single-crystal chemical vapor deposition (CVD) diamonds with low nitrogen concentrations, which were fabricated by microwave plasma-assisted chemical vapor deposition at high growth rates. High optical quality undoped 500 µm-thick single-crystal CVD diamonds grown without intentional nitrogen addition proved to be excellent as windows on SAXS cells, yielding parasitic scattering no more intense than a 7.5 µm-thick Kapton film. A single-crystal CVD diamond window was successfully used in a high-pressure SAXS cell.

Momentum-resolved resonant inelastic X-ray scattering on a single crystal under high pressure

2013 ◽  
Vol 21 (1) ◽  
pp. 131-135 ◽  
Author(s):  
Masahiro Yoshida ◽  
Kenji Ishii ◽  
Ignace Jarrige ◽  
Tetsu Watanuki ◽  
Kazutaka Kudo ◽  
...  
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Diamond Anvil Cell ◽  
Ambient Pressure ◽  
Electronic Excitations ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Condition ◽  
Diamond Anvil ◽  
Ray Scattering

A single-crystal momentum-resolved resonant inelastic X-ray scattering (RIXS) experiment under high pressure using an originally designed diamond anvil cell (DAC) is reported. The diamond-in/diamond-out geometry was adopted with both the incident and scattered beams passing through a 1 mm-thick diamond. This enabled us to cover wide momentum space keeping the scattering angle condition near 90°. Elastic and inelastic scattering from the diamond was drastically reduced using a pinhole placed after the DAC. Measurement of the momentum-resolved RIXS spectra of Sr2.5Ca11.5Cu24O41at the CuK-edge was thus successful. Though the inelastic intensity becomes weaker by two orders than the ambient pressure, RIXS spectra both at the center and the edge of the Brillouin zone were obtained at 3 GPa and low-energy electronic excitations of the cuprate were found to change with pressure.

scholarly journals Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the CuK-edge

2015 ◽  
Vol 22 (4) ◽  
pp. 961-967 ◽  
Author(s):  
Didem Ketenoglu ◽  
Manuel Harder ◽  
Konstantin Klementiev ◽  
Mary Upton ◽  
Mehran Taherkhani ◽  
...  
Keyword(s):  
Single Crystal ◽  
Phonon Dispersion ◽  
Phonon Dispersion Curve ◽  
X Ray ◽  
X Ray Scattering ◽  
Single Crystal Quartz ◽  
Crystal Quartz ◽  
Edge Based ◽  
Ray Tracing Simulation ◽  
Ray Scattering

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

Raman and X-Ray Scattering Studies of High-Pressure Phases of Urea

2005 ◽  
Vol 109 (16) ◽  
pp. 8206-8215 ◽  
Author(s):  
F. J. Lamelas ◽  
Z. A. Dreger ◽  
Y. M. Gupta
Keyword(s):  
High Pressure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Sound velocity measurements of hcp Fe-Si alloy at high pressure and high temperature by inelastic X-ray scattering

2018 ◽  
Vol 103 (1) ◽  
pp. 85-90 ◽  
Author(s):  
Takanori Sakairi ◽  
Tatsuya Sakamaki ◽  
Eiji Ohtani ◽  
Hiroshi Fukui ◽  
Seiji Kamada ◽  
...  
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
Sound Velocity ◽  
Velocity Measurements ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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