Identification of open-volume defects in disordered and amorphized Si: A depth-resolved positron annihilation study
2007 ◽
Vol 446-447
◽
pp. 484-488
◽
Keyword(s):
1996 ◽
Vol 47
(3)
◽
pp. 399-403
◽
Keyword(s):
1997 ◽
Vol 116
◽
pp. 335-339
◽
2010 ◽
Vol 43
(32)
◽
pp. 325401
◽
Keyword(s):