Mechanisms of atomic and molecular ion emission during sputtering of condensedCF4molecules on Pt(111) byHe+andAr+ion bombardment

Ryutaro Souda

doi:10.1103/physrevb.63.125420

Mechanisms of atomic and molecular ion emission during sputtering of condensedCF4molecules on Pt(111) byHe+andAr+ion bombardment

Physical Review B ◽

10.1103/physrevb.63.125420 ◽

2001 ◽

Vol 63 (12) ◽

Cited By ~ 4

Author(s):

Ryutaro Souda

Keyword(s):

Ion Bombardment ◽

Molecular Ion ◽

Ion Emission

Download Full-text

Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory

Applied Surface Science ◽

10.1016/j.apsusc.2006.02.086 ◽

2006 ◽

Vol 252 (19) ◽

pp. 6413-6418 ◽

Cited By ~ 3

Author(s):

K. Wittmaack

Keyword(s):

Ion Bombardment ◽

Data Evaluation ◽

Linear Cascade ◽

Molecular Ion ◽

Polymer Layers ◽

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

Download Full-text

Secondary Molecular Ion Emission In Binary Projectile-Surface Collisions

10.1063/1.1619692 ◽

2003 ◽

Cited By ~ 1

Author(s):

T. Jalowy

Keyword(s):

Molecular Ion ◽

Ion Emission

Download Full-text

Positive Ion Emission from Metal Surfaces caused by Ion Bombardment

Proceedings of the Physical Society ◽

10.1088/0370-1328/72/3/422 ◽

1958 ◽

Vol 72 (3) ◽

pp. 467-470 ◽

Cited By ~ 9

Author(s):

A Riddoch ◽

J H Leck

Keyword(s):

Metal Surfaces ◽

Ion Bombardment ◽

Ion Emission ◽

Positive Ion

Download Full-text

STRONGLY ENHANCED SECONDARY ION EMISSION BY MOLECULAR ION IRRADIATION

Journal of Trace and Microprobe Techniques ◽

10.1081/tma-100107592 ◽

2001 ◽

Vol 19 (4) ◽

pp. 571-579 ◽

Cited By ~ 3

Author(s):

Hiroyuki Yamamoto ◽

Takeru Saito ◽

Hidehito Asaoka

Keyword(s):

Ion Irradiation ◽

Molecular Ion ◽

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

Download Full-text

High-resolution Fourier transform studies of molecular ion emission: ground state degeneracy splitting in the 1,2,3-trifluorobenzene radical cation

The Journal of Physical Chemistry ◽

10.1021/j100160a021 ◽

1991 ◽

Vol 95 (7) ◽

pp. 2727-2732 ◽

Cited By ~ 18

Author(s):

Myeong H. Suh ◽

Sang K. Lee ◽

Brent D. Rehfuss ◽

Terry A. Miller ◽

V. E. Bondybey

Keyword(s):

Fourier Transform ◽

High Resolution ◽

Radical Cation ◽

Ground State ◽

Molecular Ion ◽

Ground State Degeneracy ◽

Ion Emission

Download Full-text

Secondary ion mass spectrometry: Polyatomic and molecular ion emission

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(86)90513-6 ◽

1986 ◽

Vol 13 (1-3) ◽

pp. 259-277 ◽

Cited By ~ 11

Author(s):

Richard J. Colton ◽

Mark M. Ross ◽

David A. Kidwell

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

Download Full-text

Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets

Physical Review Letters ◽

10.1103/physrevlett.60.948 ◽

1988 ◽

Vol 60 (10) ◽

pp. 948-951 ◽

Cited By ~ 46

Author(s):

S. Della-Negra ◽

J. Depauw ◽

H. Joret ◽

Y. Le Beyec ◽

E. A. Schweikert

Keyword(s):

Ion Bombardment ◽

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

Download Full-text

Lipid specific molecular ion emission as a function of the primary ion characteristics in TOF-SIMS

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4961461 ◽

2016 ◽

Vol 34 (5) ◽

pp. 051804 ◽

Cited By ~ 3

Author(s):

Kendra J. Adams ◽

John Daniel DeBord ◽

Francisco Fernandez-Lima

Keyword(s):

Molecular Ion ◽

Tof Sims ◽

Ion Emission

Download Full-text

Sputtering and secondary ion emission of Cu-Al alloys subjected to oxygen ion bombardment

Surface Science ◽

10.1016/0039-6028(84)90464-3 ◽

1984 ◽

Vol 147 (2-3) ◽

pp. 427-432 ◽

Cited By ~ 6

Author(s):

K. Inoue ◽

Y. Taga

Keyword(s):

Ion Bombardment ◽

Al Alloys ◽

Secondary Ion Emission ◽

Oxygen Ion ◽

Ion Emission ◽

Secondary Ion

Download Full-text

A new approach to measure ion reflection and secondary ion emission during ion bombardment of atomically clean and smooth monocrystalline metal surfaces

Surface Science ◽

10.1016/0039-6028(70)90194-9 ◽

1970 ◽

Vol 20 (2) ◽

pp. 424-428 ◽

Cited By ~ 12

Author(s):

E.P.Th.M. Suurmeijer ◽

A.L. Boers ◽

S.H.A. Begemann

Keyword(s):

Metal Surfaces ◽

Ion Bombardment ◽

New Approach ◽

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

Download Full-text