Proton-implantation-induced defects inn-type6H- and4H−SiC:An electron paramagnetic resonance study

2000 ◽  
Vol 62 (15) ◽  
pp. 10126-10134 ◽  
Author(s):  
H. J. von Bardeleben ◽  
J. L. Cantin ◽  
I. Vickridge ◽  
G. Battistig
Keyword(s):  
Electron Paramagnetic Resonance ◽  
Electron Paramagnetic Resonance Study ◽  
Paramagnetic Resonance ◽  
Proton Implantation ◽  
Induced Defects ◽  
Electron Paramagnetic

scholarly journals Electron-paramagnetic-resonance study of silver-induced defects in silicon

1997 ◽  
Vol 56 (8) ◽  
pp. 4614-4619 ◽  
Author(s):  
P. N. Hai ◽  
T. Gregorkiewicz ◽  
C. A. J. Ammerlaan ◽  
D. T. Don
Keyword(s):  
Electron Paramagnetic Resonance ◽  
Electron Paramagnetic Resonance Study ◽  
Paramagnetic Resonance ◽  
Induced Defects ◽  
Electron Paramagnetic
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