Dynamic-mode scanning force microscopy study ofn-InAs(110)-(1×1)at low temperatures

2000 ◽  
Vol 61 (4) ◽  
pp. 2837-2845 ◽  
Author(s):  
A. Schwarz ◽  
W. Allers ◽  
U. D. Schwarz ◽  
R. Wiesendanger
Keyword(s):  
Low Temperatures ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Scanning Force

A Scanning Force Microscopy Study of Block Copolymers Containing a Conjugated Segment

1997 ◽  
Vol 488 ◽  
Author(s):  
Ph. Leclère ◽  
R. Lazzaroni ◽  
V. Parente ◽  
B. François ◽  
J. L. Brédas
Keyword(s):  
Diblock Copolymers ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Phase Detection ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Dynamics Calculations ◽  
Chain Composition ◽  
Scanning Force ◽  
Tapping Mode Afm

AbstractAtomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.

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