Method to extract the critical current density and the flux-creep exponent in high-Tcthin films using ac susceptibility measurements
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1999 ◽
Vol 13
(13)
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pp. 1645-1654
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2011 ◽
Vol 24
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pp. 075004
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1995 ◽
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pp. 1533-1536
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2005 ◽
Vol 66
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pp. 729-734
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2002 ◽
Vol 37
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pp. 833-839
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2011 ◽
Vol 25
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pp. 543-543
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1998 ◽
Vol 12
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pp. 1117-1124
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2001 ◽
Vol 237
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pp. 22-26
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