Direct observation of tilted vortex structures induced by twin boundaries inYBa2Cu3Oysingle crystals

1997 ◽  
Vol 56 (6) ◽  
pp. 3481-3487 ◽  
Author(s):  
A. A. Zhukov ◽  
G. K. Perkins ◽  
J. V. Thomas ◽  
A. D. Caplin ◽  
H. Küpfer ◽  
...  
1996 ◽  
Vol 105 (5-6) ◽  
pp. 1105-1110 ◽  
Author(s):  
A. A. Zhukov ◽  
G. K. Perkins ◽  
J. V. Thomas ◽  
A. D. Caplin ◽  
H. K�pfer ◽  
...  

2017 ◽  
Vol 138 ◽  
pp. 39-43 ◽  
Author(s):  
Dikai Guan ◽  
John Nutter ◽  
Joanne Sharp ◽  
Junheng Gao ◽  
W. Mark Rainforth

ACS Nano ◽  
2020 ◽  
Vol 14 (7) ◽  
pp. 8299-8306 ◽  
Author(s):  
Li Wang ◽  
Ying Wu ◽  
Yayun Yu ◽  
Aixi Chen ◽  
Huifang Li ◽  
...  

2011 ◽  
Vol 65 (6) ◽  
pp. 501-504 ◽  
Author(s):  
Jiapeng Sun ◽  
Liang Fang ◽  
Kun Sun ◽  
Jing Han

2016 ◽  
Vol 43 (16) ◽  
pp. 8426-8434 ◽  
Author(s):  
Trevor P. Almeida ◽  
Adrian R. Muxworthy ◽  
András Kovács ◽  
Wyn Williams ◽  
Leslei Nagy ◽  
...  

2014 ◽  
Vol 104 (8) ◽  
pp. 082907 ◽  
Author(s):  
Tatyana Zykova-Timan ◽  
Ekhard K. H. Salje

1990 ◽  
Vol 64 (8) ◽  
pp. 966-969 ◽  
Author(s):  
W. Kwok ◽  
U. Welp ◽  
G. Crabtree ◽  
K. Vandervoort ◽  
R. Hulscher ◽  
...  

Author(s):  
R. W. Anderson ◽  
D. L. Senecal

A problem was presented to observe the packing densities of deposits of sub-micron corrosion product particles. The deposits were 5-100 mils thick and had formed on the inside surfaces of 3/8 inch diameter Zircaloy-2 heat exchanger tubes. The particles were iron oxides deposited from flowing water and consequently were only weakly bonded. Particular care was required during handling to preserve the original formations of the deposits. The specimen preparation method described below allowed direct observation of cross sections of the deposit layers by transmission electron microscopy.The specimens were short sections of the tubes (about 3 inches long) that were carefully cut from the systems. The insides of the tube sections were first coated with a thin layer of a fluid epoxy resin by dipping. This coating served to impregnate the deposit layer as well as to protect the layer if subsequent handling were required.


Author(s):  
P.E. Batson ◽  
C.R.M. Grovenor ◽  
D.A. Smith ◽  
C. Wong

In this work As doped polysilicon was deposited onto (100) silicon wafers by APCVD at 660°C from a silane-arsine mixture, followed by a ten minute anneal at 1000°C, and in one case a further ten minute anneal at 700°C. Specimens for TEM and STEM analysis were prepared by chemical polishing. The microstructure, which is unchanged by the final 700°C anneal,is shown in Figure 1. It consists of numerous randomly oriented grains many of which contain twins.X-ray analysis was carried out in a VG HB5 STEM. As K α x-ray counts were collected from STEM scans across grain and twin boundaries, Figures 2-4. The incident beam size was about 1.5nm in diameter, and each of the 20 channels in the plots was sampled from a 1.6nm length of the approximately 30nm line scan across the boundary. The bright field image profile along the scanned line was monitored during the analysis to allow correlation between the image and the x-ray signal.


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