scholarly journals Josephson-junction thermodynamics and the superconducting phase transitionin a SQUID device

1997 ◽  
Vol 55 (14) ◽  
pp. R8697-R8700 ◽  
Author(s):  
Alec Maassen van den Brink ◽  
H. Dekker
Keyword(s):  
Josephson Junction ◽  
Superconducting Phase

scholarly journals Manipulating the magnetic state of a carbon nanotube Josephson junction using the superconducting phase

2015 ◽  
Vol 91 (24) ◽  
Author(s):  
R. Delagrange ◽  
D. J. Luitz ◽  
R. Weil ◽  
A. Kasumov ◽  
V. Meden ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Josephson Junction ◽  
Magnetic State ◽  
Superconducting Phase

Secondary electron imaging of YBa2Cu3O7-x high-Tc superconductors in Scanning Transmission Electron Microscope

1989 ◽  
Vol 47 ◽  
pp. 684-685
Author(s):  
D. R. Liu ◽  
D. B. Williams
Keyword(s):  
Electron Microscope ◽  
Secondary Electron ◽  
Scanning Transmission Electron Microscope ◽  
Superconducting Phase ◽  
Contrast Imaging ◽  
High Tc ◽  
Bright Contrast ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Imaging

The secondary electron imaging technique in a scanning electron microscope (SEM) has been used first by Millman et al. in 1987 to distinguish between the superconducting phase and the non-superconducting phase of the YBa2Cu3O7-x superconductors. They observed that, if the sample was cooled down below the transition temperature Tc and imaged with secondary electrons, some regions in the image would show dark contrast whereas others show bright contrast. In general, the contrast variation of a SEM image is the variation of the secondary electron yield over a specimen, which in turn results from the change of topography and conductivity over the specimen. Nevertheless, Millman et al. were able to demonstrate with their experimental results that the dominant contrast mechanism should be the conductivity variation and that the regions of dark contrast were the superconducting phase whereas the regions of bright contrast were the non-superconducting phase, because the latter was a poor conductor and consequently, the charge building-up resulted in high secondary electron emission. This observation has since aroused much interest amoung the people in electron microscopy and high Tc superconductivity. The present paper is the preliminary report of our attempt to carry out the secondary electron imaging of this material in a scanning transmission electron microscope (STEM) rather than in a SEM. The advantage of performing secondary electron imaging in a TEM is obvious that, in a TEM, the spatial resolution is higher and many more complementary techniques, e.g, diffraction contrast imaging, phase contrast imaging, electron diffraction and various microanalysis techniques, are available.

AN APPLICATION OF FOKKER–PLANCK EQUATION TO JOSEPHSON JUNCTION

1989 ◽  
Vol 9 (1) ◽  
pp. 109-120
Author(s):  
G. Liao ◽  
A.F. Lawrence ◽  
A.T. Abawi
Keyword(s):  
Josephson Junction ◽  
Planck Equation ◽  
Fokker Planck Equation ◽  
Fokker Planck

On the theory of the superconducting phase in organic conductors

1986 ◽  
Vol 47 (2) ◽  
pp. 175-180 ◽  
Author(s):  
S. Brazovskii ◽  
V. Yakovenko
Keyword(s):  
Organic Conductors ◽  
Superconducting Phase

EFFECT OF ORDER PARAMETER RELAXATION ON JOSEPHSON JUNCTION TRANSIENTS

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-550-C6-551
Author(s):  
H. Suhl ◽  
J. Hurell ◽  
A. H. Silver ◽  
Y. Song
Keyword(s):  
Josephson Junction ◽  
Order Parameter
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