Direct observation of thec(8×8) defect structure on Si(001) using scanning tunneling microscopy

1996 ◽  
Vol 54 (19) ◽  
pp. 13468-13471 ◽  
Author(s):  
P. W. Murray ◽  
R. Lindsay ◽  
F. M. Leibsle ◽  
P. L. Wincott ◽  
G. Thornton
2017 ◽  
Vol 10 (4) ◽  
pp. 045701 ◽  
Author(s):  
Satoshi Hiura ◽  
Akira Ikeuchi ◽  
Masafumi Jochi ◽  
Riku Yamazaki ◽  
Sotaro Takahashi ◽  
...  

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