Direct observation of thec(8×8) defect structure on Si(001) using scanning tunneling microscopy
1996 ◽
Vol 54
(19)
◽
pp. 13468-13471
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1997 ◽
Vol 79
(21)
◽
pp. 4222-4225
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Keyword(s):
1996 ◽
Vol 118
(2)
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pp. 393-400
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1993 ◽
Vol 70
(10)
◽
pp. 1441-1444
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2008 ◽
Vol 77
(11)
◽
pp. 114707
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1999 ◽
Vol 437
(1-2)
◽
pp. L755-L760
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