Evidence for a strain-stabilized bct phase of cobalt deposited on Pd{100}: An x-ray photoelectron diffraction study

1996 ◽  
Vol 54 (16) ◽  
pp. 11762-11768 ◽  
Author(s):  
Hélène Giordano ◽  
Andrea Atrei ◽  
Marco Torrini ◽  
Ugo Bardi ◽  
Michael Gleeson ◽  
...  
Keyword(s):  
Diffraction Study ◽  
X Ray ◽  
Photoelectron Diffraction

The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study

2010 ◽  
Vol 133 (21) ◽  
pp. 214701 ◽  
Author(s):  
Rong Rong Zhan ◽  
Erik Vesselli ◽  
Alessandro Baraldi ◽  
Silvano Lizzit ◽  
Giovanni Comelli
Keyword(s):  
Diffraction Study ◽  
Ultrathin Film ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rh Oxide

X‐ray photoelectron diffraction study of YbAs/GaAs(001) and ScAs/GaAs(001) heterostructures

1994 ◽  
Vol 76 (9) ◽  
pp. 5218-5224 ◽  
Author(s):  
B. Lépine ◽  
A. Quémerais ◽  
D. Sébilleau ◽  
G. Jézéquel ◽  
D. Agliz ◽  
...  
Keyword(s):  
Diffraction Study ◽  
X Ray ◽  
Photoelectron Diffraction

X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

2013 ◽  
Vol 113 (6) ◽  
pp. 063511 ◽  
Author(s):  
C. Raisch ◽  
C. Langheinrich ◽  
R. Werner ◽  
R. Kleiner ◽  
D. Koelle ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray ◽  
Photoelectron Diffraction

Growth kinetics ofCaF2/Si(111) heteroepitaxy: An x-ray photoelectron diffraction study

1995 ◽  
Vol 51 (8) ◽  
pp. 5352-5365 ◽  
Author(s):  
J. D. Denlinger ◽  
Eli Rotenberg ◽  
U. Hessinger ◽  
M. Leskovar ◽  
Marjorie A. Olmstead
Keyword(s):  
Diffraction Study ◽  
Growth Kinetics ◽  
X Ray ◽  
Photoelectron Diffraction

X-ray-photoelectron-diffraction study of InAs/InP(001) heterostructures

1994 ◽  
Vol 49 (19) ◽  
pp. 13542-13553 ◽  
Author(s):  
E. Bergignat ◽  
M. Gendry ◽  
G. Hollinger ◽  
G. Grenet
Keyword(s):  
Diffraction Study ◽  
X Ray ◽  
Photoelectron Diffraction

PHOTOELECTRON DIFFRACTION STUDY OF THE INITIAL-STAGE GROWTH OF Cu ON Ge(111)-c(2×8)

1999 ◽  
Vol 06 (06) ◽  
pp. 1079-1083 ◽  
Author(s):  
S. OMORI ◽  
A. NARIMATSU ◽  
T. SUZUKI ◽  
Y. NIHEI
Keyword(s):  
Surface Layer ◽  
Diffraction Study ◽  
Multiple Scattering ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Initial Stage ◽  
Two Phases ◽  
Simple Models

Two phases in the initial stages of Cu growth on Ge(111) have been investigated by using X-ray photoelectron diffraction (XPED). Multiple-scattering analysis showed that the surface layer of the discommensurate phase consists of almost the same amount of two kinds of domains with regular and fault stackings. Furthermore, it was found that the ordered overlayer was formed after annealing the discommensurate phase and that the XPED pattern from the annealed phase cannot be explained by the simple models such as bulklike Cu and stoichiometric germanide Cu 3 Ge .

An X-ray absorption and photoelectron diffraction study of the Cu{100} c(2 × 2) CO structure

1986 ◽  
Vol 166 (1) ◽  
pp. A42
Author(s):  
C.F. McConville ◽  
D.P. Woodruff ◽  
K.C. Prince ◽  
G. Paolucci ◽  
V. Chab ◽  
...  
Keyword(s):  
Diffraction Study ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
X Ray Absorption
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