Raman study of free-standing porous silicon

1996 ◽  
Vol 53 (4) ◽  
pp. 1937-1947 ◽  
Author(s):  
H. Tanino ◽  
A. Kuprin ◽  
H. Deai ◽  
N. Koshida
Author(s):  
Sebastiano Trusso ◽  
Cirino Vasi ◽  
Maria Allegrini ◽  
Francesco Fuso ◽  
Giovanni Pennelli

1998 ◽  
Vol 536 ◽  
Author(s):  
H. Koyama ◽  
P. M. Fauchet

AbstractThe optical properties of oxidized free-standing porous silicon films excited by a cw laser have been investigated. It is found that samples oxidized at 800–950 °C show a strongly superlinear light emission at an excitation intensity of ∼10 W/cm2. This emission has a peak at 900–1100 nm and shows a blueshift as the oxidation temperature is increased. These samples also show a very large induced absorption, where the transmittance is found to decrease reversibly by ≤99.7 %.The induced absorption increases linearly with increasing pump laser intensity. Both the superlinear emission and the large induced absorption are quenched when the samples are attached to materials with a higher thermal conductivity, suggesting that laser-induced thermal effects are responsible for these phenomena.


2019 ◽  
Vol 16 (3) ◽  
pp. 211-219 ◽  
Author(s):  
Bernard Gelloz ◽  
Kouichiro Murata ◽  
Toshiyuki Ohta ◽  
Mher Ghulinyan ◽  
Lorenzo Pavesi ◽  
...  

2003 ◽  
Vol 93 (12) ◽  
pp. 9724-9729 ◽  
Author(s):  
M. Ghulinyan ◽  
C. J. Oton ◽  
G. Bonetti ◽  
Z. Gaburro ◽  
L. Pavesi

1999 ◽  
Vol 605 ◽  
Author(s):  
M. Morel ◽  
M. Le Berre ◽  
V. Lysenko ◽  
G. Delhomme ◽  
A. Dittmar ◽  
...  

AbstractPorous silicon (PS) is generated by electrochemical etching in hydrofluoric acid (HF). Recently porous silicon has been applied to micromachining and micro-devices as an alternate material, this material being used as a sacrificial layer. This technology competes with conventional techniques like surface and bulk micromachining regarding its speed, simplicity and reduced costs. A wide range of microstructures and free-standing structures can be fabricated with a large freedom of design in relation to the isotropic behavior of the etching. A sacrificial layer may be realized fast over varying thickness (PS formation rate 45 μm/h compared to silicon bulk micromachining rate 20 μm/h for KOH etching).This contribution is devoted to the materials aspects of patterning and processing: we will show how basic microstructures (trenches, polysilicon cantilevers, polysilicon free-standing membranes) may be fabricated using a very simple process based on a single photolithography. The important points are the choice of the mask, porous silicon properties as a function of its formation parameters and the choice of the solution removing the sacrificial layer. The morphology and porosity of the porous silicon layers are indeed mainly determined by the electrolyte composition and by the current density for a given substrate type. Optimized conditions (HF 15% and 80 mA/cm2) lead us to an appropriate porous silicon. Finally the applicability of this technology for various microsensors will be underlined.


1996 ◽  
Vol 452 ◽  
Author(s):  
J. Von Behren ◽  
P. M. Fauchet ◽  
E. H. Chimowitz ◽  
C. T. Lira

AbstractHighly luminescent free-standing porous silicon thin films of excellent optical quality have been manufactured by using electrochemical etching and lift-off steps combined with supercritical drying. One to 50 μm thick free-standing layers made from highly (p+) and moderately (p) Boron doped single crystal silicon (c-Si) substrates have been produced with porosities (P) up to 95 %. The Fabry-Pérot fringes observed in the transmission and photoluminescence (PL) spectra are used to determine the refractive index. At the highest P the index of refraction is below 1.2 from the IR to 2 eV. The absorption coefficients follow a nearly exponential behavior in the energy range from 1.2 eV and 4 eV. The porosity corrected absorption spectra of free-standing films made from p type c-Si substrates are blue shifted with respect to those prepared from p+ substrates. For P > 70 % a blue shift is also observed in PL. At equal porosities the luminescence intensities of porous silicon films made from p+ and p type c-Si are different by one order of magnitude.


RSC Advances ◽  
2015 ◽  
Vol 5 (101) ◽  
pp. 83139-83143 ◽  
Author(s):  
Huafang Zhang ◽  
Quanjun Li ◽  
Pengfei Shen ◽  
Qing Dong ◽  
Bo Liu ◽  
...  

Micro-sized rods show a lower phase transition temperature than nano-sized rods, and this is interpreted on the basis of nucleating defects.


2015 ◽  
Vol 5 (10) ◽  
pp. 2128 ◽  
Author(s):  
Romain Guider ◽  
Cristina Traversa ◽  
Paolo Bettotti

1996 ◽  
Vol 68 (5) ◽  
pp. 687-689 ◽  
Author(s):  
A. Diligenti ◽  
A. Nannini ◽  
G. Pennelli ◽  
F. Pieri

1995 ◽  
Vol 405 ◽  
Author(s):  
V. Klimov ◽  
D. Mcbranch ◽  
V. Karavanskii

AbstractLarge photo-induced absorption signals were observed in free standing porous silicon films in the spectral range from 1.1 to 2.5 eV using a femtosecond pump and probe technique. The measured nonlinear signal has a very fast component with relaxation constants from 800 fs to tens of picoseconds superimposed on the slow-relaxing thermal background. The spectral structure and relaxation dynamics of the short-lived component of transient absorption show the presence of molecular-like Si complexes with well defined energy levels and spectrally uniform picosecond relaxation dynamics.


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