Characterization of Ge/SiGe strained-barrier quantum-well structures using photoreflectance spectroscopy
2021 ◽
Vol 39
(3)
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pp. 033205
2000 ◽
Vol 39
(Part 1, No. 10)
◽
pp. 5781-5787
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Keyword(s):
1986 ◽
Vol 4
(2)
◽
pp. 551
2002 ◽
Vol 389-393
◽
pp. 1497-1500