scholarly journals X-ray-reflectivity study of the growth kinetics of vapor-deposited silver films

1994 ◽  
Vol 49 (7) ◽  
pp. 4902-4907 ◽  
Author(s):  
C. Thompson ◽  
G. Palasantzas ◽  
Y. P. Feng ◽  
S. K. Sinha ◽  
J. Krim
1999 ◽  
Vol 06 (06) ◽  
pp. 1053-1060 ◽  
Author(s):  
N. TABET ◽  
J. AL-SADAH ◽  
M. SALIM

X-ray Photoelectron Spectroscopy (XPS) has been used to investigate the oxidation of (011) Ge substrates. The sample surfaces were CP4-etched, then annealed in situ, at different temperatures, for various durations. Dry and wet atmospheres were used. The oxidation rate during the early stage was increased by the presence of moisture in the atmosphere. A simple model was used to define and determine an apparent thickness of the oxide film from XPS measurements. The time dependence of the apparent thickness is consistent with a partial coverage of the surface by oxide islands. The growth kinetics of the oxide islands obeys a nearly cubic law.


2000 ◽  
Vol 104 (11) ◽  
pp. 2467-2476 ◽  
Author(s):  
H. Natter ◽  
M. Schmelzer ◽  
M.-S Löffler ◽  
C. E. Krill ◽  
A. Fitch ◽  
...  

Nanomaterials ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 134 ◽  
Author(s):  
Izabella Kwiecien ◽  
Piotr Bobrowski ◽  
Anna Wierzbicka-Miernik ◽  
Lidia Litynska-Dobrzynska ◽  
Joanna Wojewoda-Budka

Reactivity in nickel–aluminum system was examined for two variants of nickel substrates in terms of the size and shape of Ni grains. The microstructure transformation aroused due to the annealing at 720 °C for different annealing times (0.25 to 72 h) was consequently followed. The sequence of formation of the particular intermetallic phases was given. The interconnection zones were examined by means of scanning electron microscopy supported with energy dispersive X-ray spectroscopy and electron backscattered diffraction techniques as well as by the transmission electron microscopy. The growth kinetics data for AlNi, AlNiNi-rich and AlNi3 phases for both variants of substrates was given, indicating the differences obtained in previous works on this subject.


2010 ◽  
Vol 256 (23) ◽  
pp. 7178-7185 ◽  
Author(s):  
K. McLeod ◽  
S. Kumar ◽  
N.K. Dutta ◽  
R.St.C. Smart ◽  
N.H. Voelcker ◽  
...  

1993 ◽  
Vol 12 (4) ◽  
pp. 183-192 ◽  
Author(s):  
G.I. Rosen, ◽  
S.F. Dirnfeld, ◽  
M. Bamberger, ◽  
B. Prinz,

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