X-ray-diffraction determination of the Ni-dopant site in single-crystalYBa2Cu3O7−δ

1994 ◽  
Vol 49 (17) ◽  
pp. 12170-12175 ◽  
Author(s):  
S. A. Hoffman ◽  
M. A. Castro ◽  
G. C. Follis ◽  
S. M. Durbin
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Determination ◽  
Ni Dopant

X-ray diffraction determination of a semiconductor epilayer unit cell oriented and distorted arbitrarily

1993 ◽  
Vol 26 (4A) ◽  
pp. A181-A187 ◽  
Author(s):  
B F Usher ◽  
G W Smith ◽  
S J Barnett ◽  
A M Keir ◽  
A D Pitt
Keyword(s):  
Unit Cell ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Determination

X-Ray Diffraction Determination of Metallurgical Damage in Turbo Blower Rotor Shafts

1988 ◽  
Vol 142 ◽  
Author(s):  
John F. Porter ◽  
Dan O. Morehouse ◽  
Mike Brauss ◽  
Robert R. Hosbons ◽  
John H. Root ◽  
...  
Keyword(s):  
Residual Stress ◽  
Hole Drilling ◽  
X Ray Diffraction ◽  
X Ray ◽  
Turbo Blower ◽  
Diffraction Determination ◽  
Defence Research ◽  
Stress Profiles ◽  
Non Destructive

AbstractStudies have been ongoing at Defence Research Establishment Atlantic on the evaluation of non-destructive techniques for residual stress determination in structures. These techniques have included neutron diffraction, x-ray diffraction and blind-hole drilling. In conjunction with these studies, the applicability of these procedures to aid in metallurgical and failure analysis investigations has been explored. The x-ray diffraction technique was applied to investigate the failure mechanism in several bent turbo blower rotor shafts. All examinations had to be non-destructive in nature as the shafts were considered repairable. It was determined that residual stress profiles existed in the distorted shafts which strongly indicated the presence of martensitic microstuctures. These microstructures are considered unacceptable for these shafts due to the potential for cracking or in-service residual stress relaxation which could lead to future shaft distortion.

X‐ray diffraction determination of interfacial roughness correlation in SixGe1−x/Si and GaAs/AlxGa1−xAs superlattices

1992 ◽  
Vol 60 (24) ◽  
pp. 2986-2988 ◽  
Author(s):  
Y. H. Phang ◽  
D. E. Savage ◽  
T. F. Kuech ◽  
M. G. Lagally ◽  
J. S. Park ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
Interfacial Roughness ◽  
X Ray ◽  
Diffraction Determination

X-Ray Diffraction Determination of α-Quartz in Respirable and Total Dust Samples from Sand-Blasting Operations

AIHAJ ◽  
1974 ◽  
Vol 35 (11) ◽  
pp. 711-717 ◽  
Author(s):  
GARY C. ALLEN ◽  
BEHZAD SAMIMI ◽  
MORTON ZISKIND ◽  
HANS WEILL
Keyword(s):  
X Ray Diffraction ◽  
Sand Blasting ◽  
X Ray ◽  
Total Dust ◽  
Diffraction Determination

X-Ray Diffraction Determination of The Coefficients of Expansion of Alpha Uranium

JOM ◽  
1956 ◽  
Vol 8 (10) ◽  
pp. 1282-1285 ◽  
Author(s):  
J. R. Bridge ◽  
C. M. Schwartz ◽  
D. A. Vaughan
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Determination
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