scholarly journals X-ray specular-reflectivity study of the liquid-vapor density profile ofHe4

1993 ◽  
Vol 48 (13) ◽  
pp. 9644-9659 ◽  
Author(s):  
L. B. Lurio ◽  
T. A. Rabedeau ◽  
P. S. Pershan ◽  
Isaac F. Silvera ◽  
M. Deutsch ◽  
...  
Keyword(s):  
Density Profile ◽  
Vapor Density ◽  
X Ray ◽  
Specular Reflectivity ◽  
Liquid Vapor

scholarly journals Liquid-vapor density profile of helium: An x-ray study

1992 ◽  
Vol 68 (17) ◽  
pp. 2628-2631 ◽  
Author(s):  
L. B. Lurio ◽  
T. A. Rabedeau ◽  
P. S. Pershan ◽  
Isaac F. Silvera ◽  
M. Deutsch ◽  
...  
Keyword(s):  
Density Profile ◽  
Vapor Density ◽  
X Ray ◽  
Liquid Vapor

scholarly journals Liquid-Vapor Density Profile of Helium: An X-Ray Study

1994 ◽  
Vol 72 (2) ◽  
pp. 309-309 ◽  
Author(s):  
L. B. Lurio ◽  
T. A. Rabedeau ◽  
P. S. Pershan ◽  
Isaac F. Silvera ◽  
M. Deutsch ◽  
...  
Keyword(s):  
Density Profile ◽  
Vapor Density ◽  
X Ray ◽  
Liquid Vapor

X-ray specular reflectivity of the 4He liquid-vapor interface

1991 ◽  
Vol 169 (1-4) ◽  
pp. 507-508 ◽  
Author(s):  
L.B. Lurio ◽  
T.A. Rabedeau ◽  
P.S. Pershan ◽  
Isaac F. Silvera
Keyword(s):  
Vapor Interface ◽  
X Ray ◽  
Specular Reflectivity ◽  
Liquid Vapor

Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface

2011 ◽  
Vol 6 (09) ◽  
pp. P09004-P09004 ◽  
Author(s):  
Y Ping ◽  
O L Landen ◽  
D G Hicks ◽  
J A Koch ◽  
R Wallace ◽  
...  
Keyword(s):  
Density Profile ◽  
X Ray

scholarly journals New Measurement of the Vertical Atmospheric Density Profile from Occultations of the Crab Nebula with X-Ray Astronomy Satellites Suzaku and Hitomi

2020 ◽  
Author(s):  
Satoru Katsuda ◽  
Hitoshi Fujiwara ◽  
Yoshitaka Ishisaki ◽  
Yoshitomo Maeda ◽  
Koji Mori ◽  
...  
Keyword(s):  
Density Profile ◽  
Crab Nebula ◽  
Atmospheric Density ◽  
X Ray ◽  
The Crab Nebula

X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films

2004 ◽  
Vol 219 (4) ◽  
Author(s):  
Robert Fendt ◽  
Michael Sprung ◽  
Christian Gutt ◽  
Oliver Hermann Seeck ◽  
Metin Tolan
Keyword(s):  
Density Profile ◽  
Temperature Fluctuations ◽  
Liquid Films ◽  
Electron Density Profile ◽  
Thin Liquid Films ◽  
Inversion Method ◽  
Layered System ◽  
Small Temperature ◽  
Influence Of Temperature ◽  
X Ray

AbstractWe report on X-ray reflectivity experiments of thin liquid heptane films. The films were examined using X-ray reflectivity and modelled both as a layered system using the Parratt algorithm and using a ´phase guessing´ inversion method. Our results combined with simulations of films of shrinking thickness show that small temperature instabilities during the investigation can cause artifacts in the electron density profile. These can easily be mistaken for density os cillations near the interface as might be expected for liquid molecules near a hard wall.

Model-independent determination of the surface scattering-length-density profile from specular reflectivity data

1992 ◽  
Vol 25 (2) ◽  
pp. 129-145 ◽  
Author(s):  
J. S. Pedersen
Keyword(s):  
Density Profile ◽  
Fourier Transformation ◽  
Scattering Length ◽  
Simulated Data ◽  
Limited Range ◽  
Square Root ◽  
Scattering Length Density ◽  
Angle Scattering ◽  
Specular Reflectivity ◽  
Reflectivity Data

An approach for analysing neutron and X-ray specular reflectivity data from stratified media having variation in the scattering-length density near the surface is described. The method has its origin in small-angle scattering and it is composed of two steps: (i) indirect Fourier transformation [Glatter (1977). J. Appl. Cryst. 10, 415–421] giving the profile correlation function p(z) of the derivative dρ/dz of the scattering-length density; (ii) square-root deconvolution [Glatter (1981). J. Appl. Cryst. 14, 101–108] giving dρ/dz and ρ, the scattering-length-density profile. The only requirement for applying the method is that the scattering-length density varies only in a limited range. In nearly all cases the approach does not require any knowledge of the chemical composition of the surface layer and consequently incorporates a certain degree of objectivity. The method gives the smoothest profile which agrees with the experimental reflectivity data. The method is tested on simulated reflectivity data for a series of different surface profiles and subsequently used for analysing experimental data on fluorocarbon amphiphiles in water and salt solutions. The tests on simulated data show that the indirect Fourier transformation gives correlation functions agreeing very well with the corresponding functions of the original profiles. It is further demonstrated that the square-root deconvolution gives reliable results for the scattering-length-density profiles.

Valley density profile for highly efficient x-ray lasers with good beam quality

2007 ◽  
Vol 32 (5) ◽  
pp. 491 ◽  
Author(s):  
J. Zhao ◽  
Q. L. Dong ◽  
J. Zhang
Keyword(s):  
Density Profile ◽  
Beam Quality ◽  
X Ray ◽  
Highly Efficient ◽  
Good Beam Quality
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