Critical-current variation with Pr content inY1−xPrxBa2Cu3O7epitaxial films

1993 ◽  
Vol 48 (9) ◽  
pp. 6465-6469 ◽  
Author(s):  
M. S. Hegde ◽  
Boben Thomas ◽  
N. Y. Vasanthacharya ◽  
S. V. Bhat ◽  
V. V. Srinivasu ◽  
...  
Keyword(s):  
Critical Current ◽  
Current Variation

Critical current variation and current transfer length in multifilamentary Bi-2223/Ag tapes

1999 ◽  
Vol 9 (2) ◽  
pp. 2340-2342 ◽  
Author(s):  
A. Kasztler ◽  
M. Foiti ◽  
H. Kirchmayr ◽  
M. Polak ◽  
M. Majoros
Keyword(s):  
Critical Current ◽  
Current Transfer ◽  
Transfer Length ◽  
Current Variation

scholarly journals DC Current Driven Critical Current Variation in Sr2RuO4–Ru Junction Proved by Local Transport Measurements

2010 ◽  
Vol 79 (7) ◽  
pp. 074708 ◽  
Author(s):  
Hiroshi Kambara ◽  
Tetsuro Matsumoto ◽  
Hiromi Kashiwaya ◽  
Satoshi Kashiwaya ◽  
Hiroshi Yaguchi ◽  
...  
Keyword(s):  
Critical Current ◽  
Transport Measurements ◽  
Current Variation ◽  
Local Transport ◽  
Dc Current

scholarly journals Магнитометрическая диагностика дефектов высокотемпературных сверхпроводящих лент в градиентном магнитном поле

2019 ◽  
Vol 89 (4) ◽  
pp. 524
Author(s):  
А.И. Подливаев ◽  
С.В. Покровский ◽  
И.В. Анищенко ◽  
И.А. Руднев
Keyword(s):  
Critical Current ◽  
Permanent Magnets ◽  
External Source ◽  
Superconducting Tapes ◽  
Transverse Cracks ◽  
Technical Problems ◽  
Defect Diagnostics ◽  
Current Variation ◽  
Local Defects

AbstractA new technique for contactless magnetometric determination of the local critical current in high-temperature superconducting tapes is proposed. In contrast to conventional approaches, where currents in a superconductor are induced by a uniform magnetic field of an external source, in our variant the tape is magnetized by a series of bipolar permanent magnets. It is shown that, for solving a number of technical problems of defect diagnostics, the proposed approach is more effective than those used earlier. Two variants of diagnostics are discussed. The first variant is intended for express diagnostics of local defects (first of all, transverse cracks) in a separate tape and in a tape stack and the second variant is developed for the case of a smooth critical current variation in a separate tape. The proposed method can significantly improve the accuracy of determining the local critical current density.

scholarly journals Critical current variation as a function of transverse stress of Bi-2212 Rutherford cables

2001 ◽  
Vol 11 (1) ◽  
pp. 3577-3579 ◽  
Author(s):  
D.R. Dietderich ◽  
R.M. Scanlan ◽  
T. Hasegawa ◽  
Y. Aoki ◽  
R.S. Sokolowski ◽  
...  
Keyword(s):  
Critical Current ◽  
Transverse Stress ◽  
Current Variation

Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

1991 ◽  
Vol 49 ◽  
pp. 1080-1081
Author(s):  
P. Lu ◽  
W. Huang ◽  
C.S. Chern ◽  
Y.Q. Li ◽  
J. Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Film Growth ◽  
Chemical Vapor ◽  
Microstructural Characterization ◽  
Ion Milling ◽  
Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

Development of a thick GdBCO and ZrO2-doped GdBCO film with a high critical current on a PLD-CeO2/IBAD-GZO metal substrate

2007 ◽  
Vol 463-465 ◽  
pp. 630-632 ◽  
Author(s):  
A. Kinoshita ◽  
K. Takahashi ◽  
H. Kobayashi ◽  
Y. Yamada ◽  
A. Ibi ◽  
...  
Keyword(s):  
Critical Current ◽  
Metal Substrate
Sign in / Sign up

Export Citation Format

Share Document