Domain separation in single-crystal (ND4)2Cu(SO4)2⋅6D2O studied by x-ray diffraction at high resolution

1993 ◽  
Vol 48 (18) ◽  
pp. 13372-13377 ◽  
Author(s):  
Brian N. Figgis ◽  
Philip A. Reynolds ◽  
Jonathan C. Hanson ◽  
Ilpo Mutikainen
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Domain Separation

Synchrotron white beam x-ray topography (SWBXT) and high resolution triple axis diffraction studies on AlN layers grown on 4H- and 6H-SiC seeds

2004 ◽  
Vol 831 ◽  
Author(s):  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
Rafael Dalmau ◽  
Raoul Schlesser ◽  
Zlatko Sitar
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Large Diameter ◽  
Laser Diodes ◽  
Growth Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
White Beam ◽  
Strain Data ◽  
Growth Experiments

ABSTRACTFor nitride based devices such as LEDs, high power FETs and laser diodes, single crystal substrates of AlN are highly desirable. While the sublimation technique is suitable for growing bulk AlN crystals, appropriate seeds are also necessary for growing large diameter oriented boules. 4H- and 6H-SiC substrates which are readily available commercially can potentially be implemented as seeds for bulk AlN growth. However, issues regarding SiC decomposition at high temperatures, thermal expansion mismatch, single crystal growth, etc. need to be addressed. Towards this end, a series of growth experiments have been carried out in a resistively heated reactor using on and off-axis 4H- and 6H-SiC substrates as seeds for AlN growth from the vapor phase. Several hundred microns thick AlN layers have been grown under different growth conditions. Synchrotron white beam x-ray topography (SWBXT) has been used to map the defect distribution in the grown layers and high resolution triple axis x-ray diffraction (HRTXD) experiments were carried out to record reciprocal space maps from which tilt, mismatch and strain data can be obtained. These results are analyzed with respect to the growth conditions in order to gain a better understanding of this growth process.

Scatterless hybrid metal–single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction

2008 ◽  
Vol 41 (6) ◽  
pp. 1134-1139 ◽  
Author(s):  
Youli Li ◽  
Roy Beck ◽  
Tuo Huang ◽  
Myung Chul Choi ◽  
Morito Divinagracia
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Small Angle ◽  
Incident Beam ◽  
Single Crystal Substrate ◽  
X Ray Diffraction ◽  
Metal Base ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A simple hybrid design has been developed to produce practically scatterless aperture slits for small-angle X-ray scattering and high-resolution X-ray diffraction. The hybrid slit consists of a rectangular single-crystal substrate (e.g.Si or Ge) bonded to a high-density metal base with a large taper angle (> 10°). The beam-defining single-crystal tip is oriented far from any Bragg peak position with respect to the incident beam and hence produces none of the slit scattering commonly associated with conventional metal slits. It has been demonstrated that the incorporation of the scatterless slits leads to a much simplified design in small-angle X-ray scattering instruments employing only one or two apertures, with dramatically increased intensity (a threefold increase observed in the test setup) and improved low-angle resolution.

Structure of fluorite-like compound based on Nd5Mo3O16with lead partly substituting for neodymium

2015 ◽  
Vol 71 (2) ◽  
pp. 186-193 ◽  
Author(s):  
Alexander M. Antipin ◽  
Natalia I. Sorokina ◽  
Olga A. Alekseeva ◽  
Alexandra N. Kuskova ◽  
Elena P. Kharitonova ◽  
...  
Keyword(s):  
Crystal Structure ◽  
High Resolution ◽  
Single Crystal ◽  
Experimental Verification ◽  
X Ray Diffraction ◽  
Transmission Microscopy ◽  
X Ray ◽  
Oxygen Ion ◽  
First Time ◽  
Edx Microanalysis

A single crystal of Nd5Mo3O16with lead partly substituting for neodymium, which has a fluorite-like structure, was studied by precision X-ray diffraction, high-resolution transmission microscopy and EDX microanalysis. The crystal structure is determined in the space group Pn\bar 3n. It was found that the Pb atoms substitute in part for Nd atoms in the structure and are located in the vicinity of Nd2 positions. Partial substitutions of Mo cations for Nd positions and of Nd for Mo positions in crystals of theLn5Mo3O16oxide family are corroborated by X-ray diffraction for the first time. The first experimental verification of the location of an additional oxygen ion in the voids abutting MoO4tetrahedra was obtained.

Preparation, single-crystal X-ray diffraction and high-resolution NMR spectroscopic analyses of N-[(1,4-anhydro-5-deoxy-2,3-O-isopropylidene-d,l-ribitol)-5-yl]trimethylammonium iodide

2006 ◽  
Vol 341 (11) ◽  
pp. 1916-1921 ◽  
Author(s):  
Barbara Dmochowska ◽  
Eugenia Skorupa ◽  
Lucyna Pellowska-Januszek ◽  
Monika Czarkowska ◽  
Artur Sikorski ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Spectroscopic Analyses ◽  
High Resolution Nmr

Characterization of an Yb:LuVO4 single crystal using X-ray topography, high-resolution X-ray diffraction, and X-ray photoelectron spectroscopy

2011 ◽  
Vol 80 (10) ◽  
pp. 1001-1007 ◽  
Author(s):  
W. Paszkowicz ◽  
P. Romanowski ◽  
J. Bąk-Misiuk ◽  
W. Wierzchowski ◽  
K. Wieteska ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Photoelectron Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray
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