X-ray photoemission spectroscopy studies of cerium thin films on transition-metal foils: Ce/Re, Ce/Ir, and Ce/Pt

1993 ◽  
Vol 47 (24) ◽  
pp. 16477-16485 ◽  
Author(s):  
J. Tang ◽  
J. M. Lawrence ◽  
J. C. Hemminger
2018 ◽  
Vol 10 ◽  
pp. 129-135 ◽  
Author(s):  
Nanan Li ◽  
Pengfei Zhu ◽  
Yang Chen ◽  
Xiulan Duan ◽  
Fapeng Yu

1991 ◽  
Vol 35 (B) ◽  
pp. 845-850
Author(s):  
Francis Fujiwara ◽  
George Andermann

Variable sample exit angle x-ray fluorescence spectroscopy (VEA-XRF) employing the Lβ/Lα intensity ratio for transition metals and their oxides has been shown to be useful for non-destructively studying transition metal surfaces and oxidation, as well as, superconductors. Thus the theoretical formulation of the Lβ/Lα intensity ratio dependence on the sample exit angle, θe, is of some interest and we develop it here. We also present methods of obtaining parameters needed in the formulation, such as Lβ absorption coefficients, which are not available in the literature, for wavelengths greater than about 12Å.


1988 ◽  
Vol 32 ◽  
pp. 261-268 ◽  
Author(s):  
George Andermann ◽  
Francis Fujiwara ◽  
T.C. Huang ◽  
J.K. Howard ◽  
N. Staud

Recently variable sample exit-angle x-ray fluorescence spectrometry (VEA-XRF) has been shorn to be a useful analytical tool for monitoring the oxidation of the surfaces of bulk Cu, Ni as well as that of Fe. In these studies advantage was taken of the well known phenomenon that for each transition metal oxide (MO) Lβ/Lα intensity ratio value is higher than for the transition metal (M), itself. Within the limits of the photon-escape depth de, which for these photons are generally below 5000 Å, varying the sample exit-angle θ offers an opportunity for seeing whether or not the oxidation of the surfaces of bulk M belongs to one of the following two classes: (I) uniform oxidation throughout the entire observable sample-depth, (II) preferential oxidation of the top surface layer, i.e. depth dependent oxidation.


1998 ◽  
Vol 5 (3) ◽  
pp. 536-538 ◽  
Author(s):  
Takeshi Nakatani ◽  
Yuji Saitoh ◽  
Yuden Teraoka ◽  
Tetsuo Okane ◽  
Akinari Yokoya

An undulator beamline for spectroscopy studies focusing on the electronic structure of actinide materials is under construction. Linearly or circularly polarized soft X-rays are provided by employing a variably polarizing undulator. Varied-line-spacing plane gratings and a sagittal-focusing system are used to monochromatize the undulator beam, whose energy ranges from 0.3 to 1.5 keV. A resolving power of 104 is expected in the whole energy region. These components are methodically operated by the SPring-8 beamline control system. There are three experimental stations in the beamline. In one of the stations the photoemission spectroscopy experiments are carried out at a radioisotope-controlled area where actinide compounds as well as unsealed radioactive materials are usable. Other experimental stations are planned in the beamline for surface photochemical reactions and biological applications.


2003 ◽  
Vol 356-357 ◽  
pp. 204-207 ◽  
Author(s):  
T.J Richardson ◽  
B Farangis ◽  
J.L Slack ◽  
P Nachimuthu ◽  
R Perera ◽  
...  

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