Scanning-tunneling-microscopy observation of aluminum on GaAs(110) surfaces

1991 ◽  
Vol 44 (7) ◽  
pp. 3187-3190 ◽  
Author(s):  
M. Suzuki ◽  
T. Fukuda
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Microscopy Observation ◽  
Tunneling Microscopy

Scanning tunneling microscopy observation of ultrathin epitaxial CoSi2(111) films grown at a high temperature

2015 ◽  
Vol 60 (10) ◽  
pp. 1508-1514 ◽  
Author(s):  
A. A. Alekseev ◽  
D. A. Olyanich ◽  
T. V. Utas ◽  
V. G. Kotlyar ◽  
A. V. Zotov ◽  
...  
Keyword(s):  
High Temperature ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Microscopy Observation ◽  
Tunneling Microscopy

Ultra High Vacuum Scanning Tunneling Microscopy Observation of Multilayer Step Structure on GaAs and AlAs Vicinal Surface Grown by Metalorganic Vapor Phase Epitaxy

1996 ◽  
Vol 448 ◽  
Author(s):  
Jun-Ya Ishizaki ◽  
Yasuhiko Ishizaki ◽  
Takashi Fukui
Keyword(s):  
Scanning Tunneling Microscopy ◽  
High Vacuum ◽  
Gaas Layer ◽  
Layer Growth ◽  
Ultra High Vacuum ◽  
Scanning Tunneling ◽  
Vicinal Surface ◽  
Microscopy Observation ◽  
Tunneling Microscopy ◽  
Atomic Structures

AbstractWe observe the atomic structures at the multilayer step region on MOVPE-grown GaAs (001) vicinal surface using ultra high vacuum scanning tunneling microscopy (UHV-STM), and clarify that (4×2) or (4×3) like reconstruction units are dominant. Oxide free AlAs surfaces grown on GaAs vicinal surface are also successfully observed by UHV-STM. The reconstruction units at the multilayer step region on AlAs surface have the same units on GaAs vicinal surface. GaAs surface has the lack of dimmer rows on the terrace region just below the multilayer step region, while AlAs surface has dimmer rows even on the terrace just below the multilayer step region. GaAs layer growth leads tothe step bunching phenomenon and AlAs surface leads to the step debunching phenomenon.

Scanning tunneling microscopy observation of hydrogen‐terminated Si(111) surfaces at room temperature

1994 ◽  
Vol 64 (24) ◽  
pp. 3240-3242 ◽  
Author(s):  
K. Usuda ◽  
H. Kanaya ◽  
K. Yamada ◽  
T. Sato ◽  
T. Sueyoshi ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Room Temperature ◽  
Scanning Tunneling ◽  
Microscopy Observation ◽  
Tunneling Microscopy
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