Onset of chaos and dc current-voltage characteristics of rf-driven Josephson junctions in the low-frequency regime

1990 ◽  
Vol 42 (16) ◽  
pp. 9875-9895 ◽  
Author(s):  
C. C. Chi ◽  
C. Vanneste
1996 ◽  
Vol 10 (22) ◽  
pp. 1095-1102 ◽  
Author(s):  
A.K. CHATTAH ◽  
C.B. BRIOZZO ◽  
O. OSENDA ◽  
M.O. CÁCERES

We analyze the influence of thermal noise on the Shapiro steps appearing in the current-voltage characteristics of Josephson junctions. We solve the Fokker-Planck equation describing the system by a path integral method in the steepest-descent approximation, previously applied to the stochastic resonance problem. We obtain the Asymptotic Time-Periodic Distribution Pas(ϕ, t), where ϕ∈[0, 2π] and compute from it the voltage [Formula: see text], constructing the I-V characteristics. We find a defined “softening” of the Shapiro steps as temperature increases, for values of the system parameters in the experimentally accessible range.


1980 ◽  
Author(s):  
A. K. Jain ◽  
J. E. Lukens ◽  
Kin Li ◽  
R. D. Sandell ◽  
C. Varmazis

2011 ◽  
Vol 25 (30) ◽  
pp. 2323-2333
Author(s):  
ADITI SARKAR ◽  
ARNAB GANGOPADHYAY ◽  
A. SARKAR

In this work, meta-material like behavior of natural Mica are studied. This work makes an attempt to analyze the left-handed Maxwellian (LHM) properties of Mica. The investigations carried out on natural Mica specimen are optical reflectance, optical absorbance and DC current–voltage-characteristics (CVC). Optical reflectance of Mica sheet with plane polarized monochromatic light shows distinct difference with conventional theoretical results. The DC CVC also measured with complete electromagnetic shielding. There exists a clear difference in DC characteristic for presence and absence of stray electromagnetic fields. The X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR) and ultraviolet-visible spectroscopy (UV-VIS) analysis are also carried out for further analysis. The results obtained from the optical reflectance characteristics using polarized light indicate LHM behavior as may be found in a meta-material. Micro-structural and electrical analysis shows that it is a nano-structured layered material.


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