Surface-plasmon spectrum of Ag(001) measured by high-resolution angle-resolved electron-energy-loss spectroscopy

1990 ◽  
Vol 42 (5) ◽  
pp. 2835-2841 ◽  
Author(s):  
M. Rocca ◽  
F. Biggio ◽  
U. Valbusa
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Surface Plasmon ◽  
Electron Energy Loss Spectroscopy ◽  
Electron Energy Loss ◽  
Plasmon Spectrum

ELECTRONIC PROPERTIES OF CALCIUM ULTRATHIN LAYERS ON Cu(111): A HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY STUDY

2010 ◽  
Vol 17 (04) ◽  
pp. 411-417 ◽  
Author(s):  
ANTONIO POLITANO
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electronic Properties ◽  
Electron Energy ◽  
Surface Plasmon ◽  
Electron Energy Loss Spectroscopy ◽  
Thin Layers ◽  
Resolution Electron ◽  
Ultrathin Layers ◽  
Electron Energy Loss

The electronic properties of a Ca bilayer deposited on Cu(111) have been investigated by high-resolution electron energy loss spectroscopy. For the as-deposited Ca bilayer, the surface plasmon was recorded at 3.3eV. Temperature induces a surface metal-insulator transition (evidenced by the shift of the surface plasmon energy), leading to the formation of CaO thin layers which are highly reactive towards water molecules. The presence of occupied d band in the calcium overlayer modifies surface plasmon frequency and strongly influences its dispersion relation. Results are well explained within the framework of the s-d polarization theory.

Atomic resolution characterisation of interface structures by Electron Energy Loss Spectroscopy

1993 ◽  
Vol 51 ◽  
pp. 576-577
Author(s):  
N. D. Browning ◽  
M. M. McGibbon ◽  
M. F. Chisholm ◽  
S. J. Pennycook
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Imaging Technique ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Reference Image ◽  
The Impact ◽  
Electron Energy Loss

The recent development of the Z-contrast imaging technique for the VG HB501 UX dedicated STEM, has added a high-resolution imaging facility to a microscope used mainly for microanalysis. This imaging technique not only provides a high-resolution reference image, but as it can be performed simultaneously with electron energy loss spectroscopy (EELS), can be used to position the electron probe at the atomic scale. The spatial resolution of both the image and the energy loss spectrum can be identical, and in principle limited only by the 2.2 Å probe size of the microscope. There now exists, therefore, the possibility to perform chemical analysis of materials on the scale of single atomic columns or planes.In order to achieve atomic resolution energy loss spectroscopy, the range over which a fast electron can cause a particular excitation event, must be less than the interatomic spacing. This range is described classically by the impact parameter, b, which ranges from ~10 Å for the low loss region of the spectrum to <1Å for the core losses.

Some problems and solutions in electron energy loss spectroscopy of cryosections

1993 ◽  
Vol 51 ◽  
pp. 566-567
Author(s):  
Zhifeng Shao ◽  
Ruoya Ho ◽  
Andrew P. Somlyo
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Biological Research ◽  
Specimen Thickness ◽  
Elemental Distribution ◽  
Electron Dose ◽  
Simple Assumption ◽  
Electron Energy Loss

Electron energy loss spectroscopy (EELS) has been a powerful tool for high resolution studies of elemental distribution, as well as electronic structure, in thin samples. Its foundation for biological research has been laid out nearly two decades ago, and in the subsequent years it has been subjected to rigorous, but by no means extensive research. In particular, some problems unique to EELS of biological samples, have not been fully resolved. In this article we present a brief summary of recent methodological developments, related to biological applications of EELS, in our laboratory. The main purpose of this work was to maximize the signal to noise ratio (S/N) for trace elemental analysis at a minimum dose, in order to reduce the electron dose and/or time required for the acquisition of high resolution elemental maps of radiation sensitive biological materials.Based on the simple assumption of Poisson distribution of independently scattered electrons, it had been generally assumed that the optimum specimen thickness, at which the S/N is a maximum, must be the total inelastic mean free path of the beam electron in the sample.

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