Disorder-induced line broadening in first-order Raman scattering from graphite

1990 ◽  
Vol 41 (17) ◽  
pp. 12260-12263 ◽  
Author(s):  
K. Nakamura ◽  
M. Fujitsuka ◽  
M. Kitajima
1996 ◽  
Vol 452 ◽  
Author(s):  
S. L. Fang ◽  
L. Grigorian ◽  
A. M. Rao ◽  
P. C. Eklund ◽  
G. Dresselhaus ◽  
...  

AbstractRoom temperature Raman scattering spectra are reported for the type II superconductors MxBaySi46 (M-Na, K) which were recently shown to exhibit Tc's ∼ 3.5 K. The spectra are compared to those of other Si46-clathrates which exhibit normal metallic behavior down to 2K. Thirteen of the twenty first-order Raman frequencies predicted by group theory have been detected, and the frequencies are found to be sensitive to the particular dopants. The Raman linewidths observed for the MxBaySi46 system are comparable to those observed for Na8Si46 and K7Si46. The data, taken collectively, suggest that the line broadening in the metallic Si-clathrates is due to important contributions from both the electron-phonon interaction as well as to a random filling of the Si cages.


1992 ◽  
Vol 212 (1-2) ◽  
pp. 206-215 ◽  
Author(s):  
H. Herchen ◽  
M.A. Cappelli ◽  
M.I. Landstrass ◽  
M.A. Plano ◽  
M.D. Moyer

2017 ◽  
Vol 53 (4) ◽  
pp. 1-4 ◽  
Author(s):  
Tonglei Cheng ◽  
Xiaojie Xue ◽  
Weiqing Gao ◽  
Takenobu Suzuki ◽  
Yasutake Ohishi

1982 ◽  
Vol 44 (3) ◽  
pp. 417-419 ◽  
Author(s):  
P. Ciepielewski ◽  
I. Kosacki

1985 ◽  
Vol 57 (3) ◽  
pp. 973-975 ◽  
Author(s):  
K. Ishikawa ◽  
N. Fujima ◽  
H. Komura
Keyword(s):  

2005 ◽  
Vol 71 (1) ◽  
Author(s):  
Jonathan E. Spanier ◽  
Surojit Gupta ◽  
Maher Amer ◽  
Michel W. Barsoum

1989 ◽  
Vol 03 (08) ◽  
pp. 1167-1181 ◽  
Author(s):  
P.A.M. RODRIGUES ◽  
HILDA A. CERDEIRA ◽  
F. CERDEIRA

We develop a model appropriate for describing the Raman spectrum of samples, containing a collection of semiconductor quantum dots with and without dispersion in their linear dimensions. These nanometer size crystallites are assumed to have the same atomic arrangement as that of the bulk material and to be embedded in a host material made up of a different semiconductor of the same crystal structure. The results from our calculations are compared to previous models for polycrystalline materials.


1979 ◽  
Vol 20 (4) ◽  
pp. 1758-1761 ◽  
Author(s):  
M. H. Grimsditch ◽  
D. Olego ◽  
M. Cardona

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