X-ray interference in ultrathin epitaxial layers: A versatile method for the structural analysis of single quantum wells and heterointerfaces

1989 ◽  
Vol 40 (14) ◽  
pp. 9802-9810 ◽  
Author(s):  
L. Tapfer ◽  
K. Ploog
2003 ◽  
Vol 240 (2) ◽  
pp. 297-300 ◽  
Author(s):  
T. M. Smeeton ◽  
M. J. Kappers ◽  
J. S. Barnard ◽  
M. E. Vickers ◽  
C. J. Humphreys

1988 ◽  
pp. 155-160 ◽  
Author(s):  
S. Bates ◽  
P. D. Hatton ◽  
C. A. Lucas ◽  
T. W. Ryan ◽  
S. J. Miles ◽  
...  

1995 ◽  
Vol 417 ◽  
Author(s):  
F. Peiró ◽  
A. Cornet ◽  
J. C. Ferrer ◽  
J. R. Morante ◽  
G. Halkias ◽  
...  

AbstractTransmission Electron Microscopy (TEM) and X-ray Diffraction (XRD) have been used to analyze the spontaneous appearance of lateral composition modulations in InyAl1−yAs (yIn.≅ 50%) buffer layers of single quantum well structures grown by molecular beam epitaxy on exact and vicinal (100) InP substrates, at growth temperatures in the range of 530°C–580°C. The influence of the growth temperature, substrate misorientation and epilayer mismatch on the InAlAs lateral modulation is discussed. The development of a self-induced quantum-wire like morphology in the In0.53Ga0.47As single quantum wells grown over the modulated buffers is also commented on.


1987 ◽  
Vol 31 ◽  
pp. 155-160
Author(s):  
S. Bates ◽  
P.D. Hatton ◽  
C.A. Lucas ◽  
T.W. Ryan ◽  
S.J. Miles ◽  
...  

AbstractX-ray scattering techniques at grazing incidence have been used to characterize single quantum well hetero–structures. Double–and triple-axis diffractometry has been used to determine lattice mismatch and layer thickness of a 250Å thick layer of AlInAs grown by MBE on an InP substrate and capped by a 45Å GaAs layer. Reflectivity measurements in the triple – crystal mode permit accurate measurement of individual layer thicknesses, relative electron density and interface roughnesses on the Angstrom level.


1995 ◽  
Author(s):  
Alexey V. Svitelskiy ◽  
Galina N. Semenova ◽  
Vasily P. Klad'ko ◽  
Tatyana G. Kryshtab

2014 ◽  
Vol 11 (3-4) ◽  
pp. 393-396
Author(s):  
Guangxu Ju ◽  
Yoshihiro Kato ◽  
Yoshio Honda ◽  
Masao Tabuchi ◽  
Yoshikazu Takeda ◽  
...  

2003 ◽  
Vol 17 (02) ◽  
pp. 49-55
Author(s):  
G. CERBANIC ◽  
I. BURDA ◽  
Gh. BORODI ◽  
I. CHICINAS ◽  
I. VIDA SIMITTI ◽  
...  

X-ray diffraction and scanning microscopy were used to analyze the structure of CdSe epitaxial layers. The structural data indicate the growth from CdSe layers of crystallites corresponding to the hexagonal modification. The lifetime distribution of electric carriers investigated by photoconductive frequency-resolved spectroscopy allows for the appreciation of the carrier kinetics in the studied semiconducting layers.


1995 ◽  
Vol 406 ◽  
Author(s):  
D. T. Emerson ◽  
J. A. Smart ◽  
K. L. Whittingham ◽  
E. M. Chumbes ◽  
J. R. Shealy

AbstractBulk GaAsP, 20Å–500Å GaAsP/GaInP single quantum wells and 70 Å period GaAsP/GaInP superlattices were deposited on GaAs substrates by Flow Modulation Epitaxy. In these structures, the disordered GaInP is lattice matched while the GaAsP is in tension with the As mole fraction varying from 0.6 to 1. The structures were studied using asymmetric x-ray diffraction, 1K photoluminescence, Raman scattering, transmission electron microscopy and atomic force microscopy. Raman and x-ray diffraction are used to assess the structural quality of the superlattices, especially with regard to the presence/absence of superlattice x-ray satellites and disorder activated longitudinal acoustic phonons. A model including the effects of composition, strain, and confinement on longitudinal optic phonons is described and used to estimate the composition, using Raman scattering, in the thin, pseudomorphic GaAsP layers in the superlattices. Photoluminescence is used to assess the composition of the interfacial layers in the single quantum wells and to determine transition energies in the superlattices. In addition, analysis of the heterostructure luminescence, including prediction of the energy band alignment as calculated with the model solid theory corrected for strain, is found to suggest the presence of a type II band alignment in the heterostructures for some values of GaAsP composition. Finally, Raman scattering and x-ray diffraction are used to compare arsenide to phosphide interfaces in GaAs and InP-based heterostructures.


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